메뉴 건너뛰기




Volumn , Issue , 2009, Pages 33-38

Analysis of 3D current flow in undoped FinFETs and approaches for compact modeling

Author keywords

Compact model; Current; FinFET; MOSFET; Potential

Indexed keywords

3D EFFECTS; ANALYTICAL MODEL; CHANNEL CROSS SECTION; CHANNEL CURRENTS; COMPACT MODEL; COMPACT MODELING; CURRENT EQUATION; CURRENT FLOWS; CURRENT PATHS; ELECTROSTATIC POTENTIALS; FINFETS; GEOMETRY EFFECTS; MOS-FET; PINCHOFF; SEMIEMPIRICAL MODELS; SILICON SURFACES; SIMPLE MODEL; SUB-THRESHOLD BEHAVIOR; SUBTHRESHOLD; SUBTHRESHOLD SLOPE; THRESHOLD CONDITION; THRESHOLD OPERATION;

EID: 72149089839     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (2)

References (11)
  • 1
    • 39549119968 scopus 로고    scopus 로고
    • Multi-gate devices for the 32nm technology node and beyond
    • Munich
    • N. Collaert et al.: Multi-gate devices for the 32nm technology node and beyond, Proceedings ESSDERC, Munich, 2007.
    • (2007) Proceedings ESSDERC
    • Collaert, N.1
  • 3
    • 0003608203 scopus 로고
    • Weber, Wiley
    • Weber: Electromagnetic fields, Volume 1, Wiley, 1950.
    • (1950) Electromagnetic Fields , vol.1
  • 4
    • 0030396983 scopus 로고    scopus 로고
    • A new analytical method of solving 2D Poisson's equation in MOS devices applied to threshold voltage and subthreshold modeling
    • A. Kloes, A. Kostka: A new analytical method of solving 2D Poisson's equation in MOS devices applied to threshold voltage and subthreshold modeling, Solid-State Electron., Vol. 39, 1996.
    • (1996) Solid-state Electron. , vol.39
    • Kloes, A.1    Kostka, A.2
  • 5
    • 53649084961 scopus 로고    scopus 로고
    • Precise modeling framework for short-channel double-gate and gate-all-around MOSFETs
    • H. Borli, S. Kolberg, T. A. Fjeldly, B. Iniguez: Precise modeling framework for short-channel double-gate and gate-all-around MOSFETs, IEEE TED, Vol. 55, No. 10, 2008.
    • (2008) IEEE TED , vol.55 , Issue.10
    • Borli, H.1    Kolberg, S.2    Fjeldly, T.A.3    Iniguez, B.4
  • 6
    • 72149115253 scopus 로고    scopus 로고
    • Version X-2005.10, Synopsys, Inc.
    • TCAD Sentaurus, Version X-2005.10, Manual, Synopsys, Inc.
    • TCAD Sentaurus, Manual
  • 7
    • 0141761518 scopus 로고    scopus 로고
    • Tri-gate fully depleted CMOS transistors: Fabrication, design and layout
    • Digest of technical papers
    • B. Doyle et al.: Tri-gate fully depleted CMOS transistors: Fabrication, design and layout. Symposium on VLSI Technology 2003, Digest of technical papers, 2003.
    • (2003) Symposium on VLSI Technology 2003
    • Doyle, B.1
  • 8
    • 0036684706 scopus 로고    scopus 로고
    • FinFET design considerations based on 3-D simulation and analytical modeling
    • G. Pei et al.: FinFET design considerations based on 3-D simulation and analytical modeling, IEEE TED, Vol. 49, No. 8, 2002.
    • (2002) IEEE TED , vol.49 , Issue.8
    • Pei, G.1
  • 9
    • 72149114314 scopus 로고    scopus 로고
    • 2D physics-based compact model for channel length modulation in lightly doped DG FETs
    • Lodz
    • M. Weidemann, A. Kloes, M. Schwarz, B. Iniguez: 2D physics-based compact model for channel length modulation in lightly doped DG FETs, Proceedings MIXDES 2009, Lodz, 2009.
    • (2009) Proceedings MIXDES 2009
    • Weidemann, M.1    Kloes, A.2    Schwarz, M.3    Iniguez, B.4
  • 10
    • 9544235193 scopus 로고    scopus 로고
    • Unified current equation for predictive modeling of submicron MOSFETs
    • A. Kloes: Unified current equation for predictive modeling of submicron MOSFETs, Solid-State Electron., Vol. 49, 2005.
    • (2005) Solid-state Electron. , vol.49
    • Kloes, A.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.