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Volumn , Issue , 2009, Pages 33-38
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Analysis of 3D current flow in undoped FinFETs and approaches for compact modeling
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Author keywords
Compact model; Current; FinFET; MOSFET; Potential
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Indexed keywords
3D EFFECTS;
ANALYTICAL MODEL;
CHANNEL CROSS SECTION;
CHANNEL CURRENTS;
COMPACT MODEL;
COMPACT MODELING;
CURRENT EQUATION;
CURRENT FLOWS;
CURRENT PATHS;
ELECTROSTATIC POTENTIALS;
FINFETS;
GEOMETRY EFFECTS;
MOS-FET;
PINCHOFF;
SEMIEMPIRICAL MODELS;
SILICON SURFACES;
SIMPLE MODEL;
SUB-THRESHOLD BEHAVIOR;
SUBTHRESHOLD;
SUBTHRESHOLD SLOPE;
THRESHOLD CONDITION;
THRESHOLD OPERATION;
FIELD EFFECT TRANSISTORS;
INTEGRATED CIRCUITS;
MOSFET DEVICES;
THREE DIMENSIONAL;
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EID: 72149089839
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
Times cited : (2)
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References (11)
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