Growth and characterization of the coexistence of vertically aligned and twinned V-shaped RuO2 nanorods on nanostructural TiO2 template

Journal of Alloys and Compounds

Volumn 485, Issue 1-2, 2009, Pages 524-528

  Chen, C A ^a   Chen, Y M ^a   Chen, K Y ^a   Chi, J K ^a   Huang, Y S ^a   Tsai, D S ^a  

^a NATIONAL TAIWAN UNIVERSITY OF SCIENCE AND TECHNOLOGY   (Taiwan)

Author keywords

Electron microscopy; Metalorganic chemical vapor deposition; Nanomaterials; Nanostructures; Oxides; X ray diffraction

Indexed keywords

ELECTRON DIFFRACTOMETRY; FIELD EMISSION SCANNING ELECTRON MICROSCOPY; HIGH QUALITY; METALORGANIC CHEMICAL VAPOR DEPOSITION; MICRO RAMAN SPECTROSCOPY; NANO-MATERIALS; NANOSTRUCTURAL; RAMAN SPECTRUM; RUTILE PHASE; SPECTROSCOPIC PROPERTY; TEM; TETRAISOPROPOXIDE; TIO; TWIN PLANES; VERTICALLY ALIGNED; WELL-ALIGNED; XRD PATTERNS;

AUGER ELECTRON SPECTROSCOPY; CHARACTERIZATION; CORUNDUM; DIFFRACTION; ELECTRONS; METALLORGANIC CHEMICAL VAPOR DEPOSITION; NANOCRYSTALS; NANORODS; NANOSTRUCTURED MATERIALS; ORGANIC CHEMICALS; OXIDE MINERALS; RAMAN SCATTERING; RAMAN SPECTROSCOPY; RUTHENIUM; RUTHENIUM ALLOYS; SCANNING ELECTRON MICROSCOPY; SEMICONDUCTING ALUMINUM COMPOUNDS; TITANIUM; TITANIUM OXIDES; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION; X RAY DIFFRACTION ANALYSIS;

RUTHENIUM COMPOUNDS;

EID: 72049101597     PISSN: 09258388     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jallcom.2009.06.017     Document Type: Article

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