The growth and characterization of well aligned RuO2 nanorods on sapphire substrates

Journal of Physics Condensed Matter

Volumn 16, Issue 47, 2004, Pages 8475-8484

  Chen, C C ^a   Chen, R S ^a   Tsai, T Y ^a   Huang, Y S ^a   Tsai, D S ^a   Tiong, K K ^b  

^a NATIONAL TAIWAN UNIVERSITY OF SCIENCE AND TECHNOLOGY   (Taiwan)

^b NATIONAL TAIWAN OCEAN UNIVERSITY   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL VAPOR DEPOSITION; MORPHOLOGY; PHONONS; RAMAN SPECTROSCOPY; SAPPHIRE; SPECTRUM ANALYSIS; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION;

CONFINEMENT EFFECTS; FIELD EMISSION; MICRO-RAMAN SPECTRA; NANORODS;

RUTHENIUM COMPOUNDS;

EID: 10244220007     PISSN: 09538984     EISSN: None     Source Type: Journal    
DOI: 10.1088/0953-8984/16/47/002     Document Type: Article

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