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Volumn , Issue , 2009, Pages 224-232

Progress in thermal characterisation methods and thermal interface technology within the "Nanopack" project

Author keywords

[No Author keywords available]

Indexed keywords

ENHANCED SURFACE; HIGH-POWER; INTERFACE TECHNOLOGY; NEW PROCESS; TECHNOLOGICAL ADVANCES; TEST STANDS; THERMAL CHARACTERISATION; THERMAL INTERFACES; THERMAL RESISTANCE; THERMAL SOLUTION; THERMAL TECHNOLOGIES; THERMO COMPRESSION BONDING;

EID: 71749119351     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (3)

References (15)
  • 4
    • 50049134641 scopus 로고    scopus 로고
    • Testing interface thermal resistance
    • M. Rencz. Testing interface thermal resistance, Proc. 9th EPTC, 2007.
    • (2007) Proc. 9th EPTC
    • Rencz, M.1
  • 8
    • 33748128921 scopus 로고    scopus 로고
    • High Laser-Wavelength Sensitivity of the Picosecond Ultrasonic Response in Transparent Thin Films
    • A. Devos, J.-F. Robillard, R. Côte et P. Emery. High Laser-Wavelength Sensitivity of the Picosecond Ultrasonic Response in Transparent Thin Films, Physical Review B 74, 6, 064114, 2006
    • (2006) Physical Review B , vol.74 , Issue.6 , pp. 064114
    • Devos, A.1    Robillard, J.-F.2    Côte, R.3    Emery, P.4
  • 9
    • 34548059731 scopus 로고    scopus 로고
    • Hierarchical Nested Surface Channels for Reduced Particle Stacking and Low-Resistance Thermal Interfaces
    • R. J. Linderman, T. Brunschwiler, U. Kloter, H. Toy, B.Michel, Hierarchical Nested Surface Channels for Reduced Particle Stacking and Low-Resistance Thermal Interfaces, Proc. 23st IEEE SEMI-THERM Symp., 2007, pp. 87-94.
    • (2007) Proc. 23st IEEE SEMI-THERM Symp , pp. 87-94
    • Linderman, R.J.1    Brunschwiler, T.2    Kloter, U.3    Toy, H.4    Michel, B.5
  • 11
    • 67349203850 scopus 로고    scopus 로고
    • B. Wunderle and B. Michel. Lifetime Modeling for Microsystems Integration - from Nano to Systems. J. of Microsystem Technologies, 15, No 6, pp 799.813, Juni 2009
    • B. Wunderle and B. Michel. Lifetime Modeling for Microsystems Integration - from Nano to Systems. J. of Microsystem Technologies, Vol 15, No 6, pp 799.813, Juni 2009


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.