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Review of Scientific Instruments

Volumn 80, Issue 11, 2009, Pages

Development of a surface conductivity measurement system for ultrahigh vacuum transmission electron microscope

(3) Minoda, H a,b Hatano, K a Yazawa, H a

a TOKYO UNIVERSITY OF AGRICULTURE AND TECHNOLOGY (Japan)

b JAPAN SCIENCE AND TECHNOLOGY AGENCY (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC STEP; CURRENT DISTRIBUTION; CURRENT VOLTAGE MEASUREMENT; DOMAIN BOUNDARY; IN-SITU; MICRO-FOUR-POINT PROBES; REFLECTION ELECTRON MICROSCOPY; SI (1 1 1); STRUCTURE DEFECTS; SURFACE CONDUCTIVITY; TEM; ULTRAHIGH VACUUM TRANSMISSION ELECTRON MICROSCOPES; VICINAL SURFACE;

CRYSTAL ATOMIC STRUCTURE; DIELECTRIC PROPERTIES; ELECTRIC CONDUCTIVITY; ELECTRIC CONDUCTIVITY MEASUREMENT; ELECTRON MICROSCOPES; PIEZOELECTRIC ACTUATORS; REFLECTION HIGH ENERGY ELECTRON DIFFRACTION; SEMICONDUCTOR QUANTUM WIRES; SILVER; SURFACE STRUCTURE; TRANSMISSION ELECTRON MICROSCOPY; ULTRAHIGH VACUUM;

SURFACE DEFECTS;

EID: 71749107107 PISSN: 00346748 EISSN: None Source Type: Journal
DOI: 10.1063/1.3251272 Document Type: Article

Times cited : (5)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.