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Volumn 23, Issue 1, 2009, Pages 76-79

Electrically stable low voltage operating ZnO thin film transistors with low leakage current Ni-doped Ba0.6Sr0.4TiO3 gate insulator

Author keywords

Gate insulator; Low voltage operation; Transistor; ZnO

Indexed keywords

BST FILM; FIELD-EFFECT MOBILITIES; GATE INSULATOR; LOW OPERATING VOLTAGE; LOW VOLTAGE OPERATION; LOW VOLTAGES; LOW-LEAKAGE CURRENT; LOW-VOLTAGE; NI-DOPED; ON/OFF RATIO; RF-MAGNETRON SPUTTERING; ROOM TEMPERATURE; SUBTHRESHOLD SWING; TIO; ZNO; ZNO THIN FILM;

EID: 71449098250     PISSN: 13853449     EISSN: 15738663     Source Type: Journal    
DOI: 10.1007/s10832-008-9538-7     Document Type: Article
Times cited : (8)

References (15)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.