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Volumn 3, Issue 4, 2009, Pages 124-126

Room-temperature epitaxial growth of high-quality m-plane InGaN films on ZnO substrates

Author keywords

[No Author keywords available]

Indexed keywords

ATOMICALLY FLAT SURFACE; HIGH QUALITY; LOW DEFECT DENSITIES; M-PLANE; RECIPROCAL SPACE; ROOM TEMPERATURE; X RAY ROCKING CURVE; X-RAY DIFFRACTION MEASUREMENTS; ZNO; ZNO SUBSTRATE;

EID: 71149113344     PISSN: 18626254     EISSN: 18626270     Source Type: Journal    
DOI: 10.1002/pssr.200903072     Document Type: Article
Times cited : (14)

References (18)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.