Electrothermal characterization of single-walled carbon nanotube (SWCNT) interconnect arrays

IEEE Transactions on Nanotechnology

Volumn 8, Issue 6, 2009, Pages 718-728

  Chen, Wen Chao ^a   Yin, Wen Yan ^a,b   Jia, Lei ^a   Liu, Qing Huo ^c  

^a SHANGHAI JIAO TONG UNIVERSITY   (China)

^b ZHEJIANG UNIVERSITY   (China)

^c DUKE UNIVERSITY   (United States)

Author keywords

Breakdown voltage; Crosstalk; Electrostatic discharge (ESD) pulse current; Equivalent electrothermal circuit model; Interconnect array; Power handling capability; Single walled carbon nanotube (SWCNT); Temperature distribution; Transient thermal response

Indexed keywords

BREAKDOWN VOLTAGE; CIRCUIT MODELS; INTERCONNECT ARRAYS; POWER-HANDLING CAPABILITY; PULSE CURRENTS; TRANSIENT THERMAL RESPONSE;

CARBON NANOTUBES; CIRCUIT THEORY; CROSSTALK; DELAY CIRCUITS; DIFFERENCE EQUATIONS; ELECTRIC BREAKDOWN; ELECTROSTATIC DEVICES; ELECTROSTATIC DISCHARGE; HEATING; HETEROJUNCTION BIPOLAR TRANSISTORS; TEMPERATURE DISTRIBUTION; THERMOANALYSIS;

SINGLE-WALLED CARBON NANOTUBES (SWCN);

EID: 70749124748     PISSN: 1536125X     EISSN: None     Source Type: Journal    
DOI: 10.1109/TNANO.2009.2019725     Document Type: Article

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