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Volumn , Issue , 2009, Pages

Validation of the porous-medium approach to model interlayer-cooled 3D-chip stacks

Author keywords

[No Author keywords available]

Indexed keywords

CONVECTIVE HEAT DISSIPATION; EXPERIMENTAL VALIDATIONS; FLOOR-PLANNING; FLUID DELIVERY; FLUID VELOCITIES; HEAT FLOWS; HEAT REMOVAL; HEAT TRANSFER STRUCTURES; HOT SPOT; JUNCTION TEMPERATURES; LOW POROSITY; MULTI-SCALE MODELING; MULTIPLE CAVITIES; NONUNIFORMITY; PIN-FINS; POROUS-MEDIA; SOLID-SOLID INTERFACES; SUBDOMAIN; SYSTEM LEVELS; TEMPERATURE RESPONSE; THERMAL FIELD; TOTAL POWER;

EID: 70549083736     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/3DIC.2009.5306530     Document Type: Conference Paper
Times cited : (38)

References (9)
  • 1
    • 70549086843 scopus 로고    scopus 로고
    • International Technology Roadmap for Semiconductors ITRS
    • International Technology Roadmap for Semiconductors (ITRS), 2008 Update - Packaging and Assembly http://www.itrs.net/Links/2008ITRS/Update/2008-Update. pdf
    • (2008) Update - Packaging and Assembly
  • 4
    • 54049110736 scopus 로고    scopus 로고
    • Interlayer Cooling Potential in Vertically Integrated Packages
    • Microsystem Technol, published online August 21
    • T. Brunschwiler, B. Michel, H. Rothuizen, U. Kloter, B. Wunderle, H. Oppermann, and H. Reichl, "Interlayer Cooling Potential in Vertically Integrated Packages", Microsystem Technol., Vol. 15, No. 1, pp. 57-74 (2009, published online August 21, 2008).
    • (2008) , vol.15 , Issue.1 , pp. 57-74
    • Brunschwiler, T.1    Michel, B.2    Rothuizen, H.3    Kloter, U.4    Wunderle, B.5    Oppermann, H.6    Reichl, H.7
  • 5
    • 34249887919 scopus 로고    scopus 로고
    • A Practical Implementation of Silicon Microchannel Coolers for High Power Chips
    • June
    • E.G. Colgan et al., "A Practical Implementation of Silicon Microchannel Coolers for High Power Chips", IEEE Trans. Components Packaging Technol., Vol. 30, No. 2., June 2007, 218-225.
    • (2007) IEEE Trans. Components Packaging Technol , vol.30 , Issue.2 , pp. 218-225
    • Colgan, E.G.1
  • 9


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.