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Volumn , Issue , 2009, Pages 40-45
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Underfill study for large dice flip chip packages
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Author keywords
[No Author keywords available]
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Indexed keywords
CHIP SIZES;
DIE CRACKS;
DIE SIZE;
ELECTRICAL PERFORMANCE;
FLIP-CHIP PACKAGES;
FLOW CHARACTERISTIC;
MASS PRODUCTION;
MECHANICAL STRESS;
PIN COUNTS;
SOLDER BUMP;
STRESS MODELING;
UNDERFILL MATERIALS;
UNDERFILL PROPERTIES;
UNDERFILLS;
WARPAGES;
CHIP SCALE PACKAGES;
CRACKS;
DIELECTRIC MATERIALS;
DIES;
FLIP CHIP DEVICES;
STRESS RELIEF;
STRESSES;
PACKAGING;
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EID: 70449753961
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1109/ICEPT.2009.5270797 Document Type: Conference Paper |
Times cited : (4)
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References (8)
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