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Volumn , Issue , 2009, Pages 40-45

Underfill study for large dice flip chip packages

Author keywords

[No Author keywords available]

Indexed keywords

CHIP SIZES; DIE CRACKS; DIE SIZE; ELECTRICAL PERFORMANCE; FLIP-CHIP PACKAGES; FLOW CHARACTERISTIC; MASS PRODUCTION; MECHANICAL STRESS; PIN COUNTS; SOLDER BUMP; STRESS MODELING; UNDERFILL MATERIALS; UNDERFILL PROPERTIES; UNDERFILLS; WARPAGES;

EID: 70449753961     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ICEPT.2009.5270797     Document Type: Conference Paper
Times cited : (4)

References (8)
  • 6
    • 0034476322 scopus 로고    scopus 로고
    • Reliability of Flip Chip BGA Package on Organic Substrate
    • May, conference
    • Ahn, Eun-Chul et al., "Reliability of Flip Chip BGA Package on Organic Substrate," Proc 50th Electronic Components and Technology Conference, May 2000, pp. 1215-1220. [conference]
    • (2000) Proc 50th Electronic Components and Technology Conference , pp. 1215-1220
    • Ahn, E.-C.1
  • 8
    • 70450112306 scopus 로고    scopus 로고
    • J-STD-030, Guideline for Selection and Application of Underfill Material for Flip Chip and other Micropackages, JEDEC, Draft 7, Dec 2000, pp. 9-10
    • J-STD-030, "Guideline for Selection and Application of Underfill Material for Flip Chip and other Micropackages", JEDEC, Draft 7, Dec 2000, pp. 9-10.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.