Total dose performance of radiation hardened voltage regulators and references

IEEE Radiation Effects Data Workshop

Volumn , Issue , 2001, Pages 1-5

  McClure, S S ^a   Gorelick, J L ^a   Pease, R L ^a   Rax, B G ^a   Ladbury, R L ^a  

^a CALIFORNIA INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BIPOLAR TRANSISTORS; DOSIMETRY; RADIATION; SENSITIVITY ANALYSIS;

ENHANCED LOW DOSE RATE SENSITIVITY (ELDRS);

VOLTAGE REGULATORS;

EID: 0035166249     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (6)

1. Enhanced low-dose-rate sensitivity of a low-dropout voltage regulator
2. Dose rate and bias dependence of total dose performance in low dropout voltage regulators
3. Modeling low-dose-rate effects in irradiated bipolar-base oxides
4. Physical mechanisms contributing to enhanced bipolar gain degradation
5. Common-source TLD and RADFET characteristics of Co60, Cs137, and x-ray irradiation sources