Development of PLZT dielectrics on base metal foils for embedded capacitors

Journal of the European Ceramic Society

Volumn 30, Issue 2, 2010, Pages 365-368

  Balachandran, U ^a   Kwon, D K ^a   Narayanan, M ^a   Ma, B ^a  

^a ARGONNE NATIONAL LABORATORY   (United States)

Author keywords

Chemical solution deposition; Dielectric property; Ferroelectric film; PLZT

Indexed keywords

BASE METALS; BREAKDOWN FIELD; BREAKDOWN STRENGTHS; CHEMICAL SOLUTION DEPOSITION; COPPER SUBSTRATES; CU FOIL; DIELECTRIC CONSTANTS; EMBEDDED CAPACITOR; PLZT; PLZT FILMS; RELATIVE PERMITTIVITY; ROOM TEMPERATURE;

CAPACITANCE; CAPACITORS; CERAMIC CAPACITORS; CHEMICALS; DIELECTRIC LOSSES; FERROELECTRIC DEVICES; FERROELECTRIC FILMS; FERROELECTRICITY; LEAD; METAL FOIL; PERMITTIVITY; ZIRCONIUM;

DIELECTRIC MATERIALS;

EID: 70350719154     PISSN: 09552219     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jeurceramsoc.2009.05.006     Document Type: Article

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