Dielectric properties of PLZT film-on-foil capacitors

Materials Letters

Volumn 62, Issue 20, 2008, Pages 3573-3575

  Ma, Beihai ^a   Kwon, Do Kyun ^a   Narayanan, Manoj ^a  

^a Balu)   (United States)

Author keywords

Breakdown strength; Ceramic capacitor; Dielectric property; Energy density; PLZT film

Indexed keywords

ELECTRIC ENERGY STORAGE; HYSTERESIS LOOPS; LEAD COMPOUNDS; LEAKAGE CURRENTS; METAL FOIL; PERMITTIVITY;

BREAKDOWN STRENGTH; ENERGY DENSITY; ENERGY STORAGE DENSITY;

CERAMIC CAPACITORS;

EID: 44349145030     PISSN: 0167577X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.matlet.2008.03.060     Document Type: Article

References (14)

1. Borland W., Doyle M., Dellis L., Renovales O., and Majumdar D. Mater. Res. Soc. Symp. Proc. 833 (2005) 143-151
2. Nelms D., Ulrich R., Schaper L., and Reeder S. Proceedings of the 48th IEEE Electronic Components and Technology Conference (1998), Institute of Electrical and Electronic Engineers, Piscataway, NJ 247-251
3. C. Chiang, D. B. Fraser, US Patent # 6949831B2, 2005.
4. Zhu Y., Zhu J., Song Y.J., and Desu S.B. Appl. Phys. Lett. 73 (1998) 1958-1960
5. Ihlefeld J., Laughlin B., Hunt-Lowery A., Borland W., Kingon A., and Maria J.P. J. Electroceramics 14 (2005) 95-102
6. Kingon A.I., and Srinivasan S. Nat. Mater. 4 (2005) 233-237
7. Zou Q., Ruda H.E., and Yacobi B.G. Appl. Phys. Lett. 78 (2001) 1282-1284
8. B. Ma, D. K. Kwon, M. Narayanan, U. Balachandran, J. Electroceramics (in press). doi:10.1007/s10832-007-9410-1.
9. Haertling G.H., and Land C.E. J. Am. Ceram. Soc. 54 (1971) 1-11
10. Dai X., DiGiovanni A., and Viehland D. J Appl. Phys. 74 (1993) 3399-3405
11. Jonscher K. Dielectric Relaxation in Solids (1983), Chelsea Dielectrics Press, London
12. Weibull W. J. Appl. Mech. 18 (1951) 293-297
13. Dissado L.A. J. Phys., D, Appl. Phys. 23 (1990) 1582-1591
14. Tuncer E., James D.R., Sauers I., Ellis A.R., and Pace M.O. J. Phys., D, Appl. Phys. 39 (2006) 4257-4268