Dielectric strength and reliability of ferroelectric PLZT films deposited on nickel substrates

Materials Letters

Volumn 63, Issue 15, 2009, Pages 1353-1356

  Ma, Beihai ^a   Narayanan, Manoj ^a  

^a Balu)   (United States)

Author keywords

Breakdown strength; Ferroelectric film; Highly accelerated lifetime test; Lead lanthanum zirconate titanate; Reliability

Indexed keywords

BREAKDOWN BEHAVIORS; BREAKDOWN STRENGTH; CHEMICAL SOLUTION DEPOSITIONS; DC ELECTRIC FIELDS; DIELECTRIC STRENGTHS; ENERGY DENSITIES; FE FILMS; HIGH FIELD STRESS; HIGH TEMPERATURES; HIGHLY ACCELERATED LIFETIME TEST; LEAD LANTHANUM ZIRCONATE TITANATE; MEAN TIME TO FAILURES; NICKEL SUBSTRATES; PLZT FILMS; VOLTAGE ACCELERATION FACTORS; WEIBULL ANALYSIS;

ACTIVATION ENERGY; CAPACITANCE; CAPACITORS; ELECTRIC BREAKDOWN; ELECTRIC FIELD EFFECTS; ELECTRODEPOSITION; FERROELECTRIC DEVICES; FERROELECTRICITY; LANTHANUM; LANTHANUM ALLOYS; LEAD; NICKEL ALLOYS; RANGE FINDING; RELIABILITY; ZIRCONIUM;

FERROELECTRIC FILMS;

EID: 64049102655     PISSN: 0167577X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.matlet.2009.03.021     Document Type: Article

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