On dielectric breakdown statistics

Journal of Physics D: Applied Physics

Volumn 39, Issue 19, 2006, Pages 4257-4268

  Tuncer, Enis ^a   Randy James, D ^a   Sauers, Isidor ^a   Ellis, Alvin R ^a   Pace, Marshall O ^b  

^a OAK RIDGE NATIONAL LABORATORY   (United States)

^b University of Tennessee Knoxville   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC INSULATING MATERIALS; ELECTRIC INSULATION; MONTE CARLO METHODS; NUMERICAL METHODS; PROBABILITY DENSITY FUNCTION; WEIBULL DISTRIBUTION;

DIELECTRIC BREAKDOWN; DISTRIBUTION FUNCTION;

ELECTRIC BREAKDOWN;

EID: 33748855247     PISSN: 00223727     EISSN: 13616463     Source Type: Journal    
DOI: 10.1088/0022-3727/39/19/020     Document Type: Article

References (25)

1. Benard A and Bos-Levenbach E 1953 Het uitzetten van waarnemingen op waarshijnlijkdeids-papier Statististica Neerlandica 7 163-73 (Translation in English can be found on http://www.barringer1.com/wa_files/The-plotting-of- observations-on-probability-paper.pdf)
2. Blom G 1958 Statistical Estimates and Transformed Beta Variables (New York: Wiley)
3. Coppard R W, Bowman J, Dissado L A, Rowland S M and Rakowski R T 1990 The effect of aluminium inclusions on the dielectric breakdown of polyethylene J. Phys. D: Appl. Phys. 23 1554-61
4. Cran G W 1976 Graphical estimation method for Weibull distributions Microelectron. Reliab. 15 47-52
5. Dissado L A 1990 Theoretical basis for statistics of dielectric breakdown J. Phys. D: Appl. Phys. 23 1582-91
6. Dissado L A 2002 Predicting electrical breakdown in polymeric insulators; from deterministic mechanisms to failure statistics IEEE Trans. Dielectr. Electr. Insul. 9 860-75
7. Filliben J J 1975 The probability plot correlation coefficient test for normality Technometrics 17 111-17
8. Fothergill J C 1990 Estimating the cumulative probability of failure data points to be plotted on Weibull and other probability paper IEEE Trans. Electr. Insul. 25 489-92
9. Gumbel E J 1958 Statistics of Extremes (New York: Columbia University Press)
10. Hill R M and Dissado L A 1983 Theoretical basis for the statistics of dielectric breakdown J. Phys. C: Solid State Phys. 16 2145-56
11. Ieda M 1984 Electrical conduction and carrier traps in polymeric materials IEEE Trans. Electr. Insul. 19 162-78
12. James D R, Sauers I, Pace M and Ellis A R 2002 High voltage breakdown of solid expoxies at room temperature and in liquid nitrogen CEIDP'02 2002 Annual Report Conf. Electrical Insulation and Dielectric Phenomena (Cancun, Mexico) (IEEE Dielectrics and Electrical Insulation Society) pp 542-5
13. Kitawaga K, Sawa G and Ieda M 1980 Observation of dielectric breakdown sites in polyethylene thin film Japan. J. Appl. Phys. 19 389-90
14. Looney S W and Gulledge T R Jr 1985 Probability plotting positions and goodness of fit for the normal distribution Statistician 34 297-303
15. Nelder J A and Mead R 1965 A simplex method for function minimization Comput. J. 7 308-13
16. Pompl T and Kerber M 2005 Failure distributions of succesive dielectric breakdown events IEEE Trans. Device Mater. Rel. 4 263-7
17. Ribes G, Mitard J, Denais M, Bruyere S, Monsieur F, Parthasarathy C, Vincent E and Ghibaudo G 2005 Review on high-k dielectrics reliability issues IEEE Trans. Device Mater. Rel. 5 5-19
18. Rowland S M, Hill R M and Dissado L A 1986 Censored Weibull statistics in the dielectric breakdown of thin oxide films J. Phys. C: Solid State Phys. 19 6263-385
19. Sauers I, James D R, Ellis A R and Pace M O 2002 High voltage studies of dielectric materials for HTS power equipment IEEE Trans. Dielectr. Electr. Insul. 9 922-31
20. Tuncer E, Sauers I, James D and Ellis A R 2006a Electrical properties of a commercial resin CEIDP'06 2006 Annual Report, Conf. Electrical Insulation and Dielectric Phenomena (Kansas City, MO) (IEEE Dielectrics and Electrical Insulation Society) at press
21. Tuncer E, Sauers I, James D, Ellis A R and Pace M 2006b Breakdown statistics of polyimide at low temperatures CEIDP'06 2006 Annual Report, Conf. Electrical Insulation and Dielectric Phenomena (Kansas City, MO) (IEEE Dielectrics and Electrical Insulation Society) at press
22. Tuncer E, Wegener M, Frübing P and Gerhard-Multhaupt R 2005 Origin of temperature dependent conductivity in α-polyvinylidene fluoride J. Chem. Phys. 122 084901 (Preprint cond-matt/0411522)
23. Weibull W 1939 A statistical theory of the strength of materials Ingeniörsvetenskapsakademiens Handlingar vol 151 (Stockholm: Generalstabens Litografiska anstalts förlag)
24. Weibull W 1951 A statistical distribution function of wide applicability J. Appl. Mech. 18 293-7
25. Wit H J d, Wijenberg C and Crevecoeur C 1976 The dielectric breakdown of anodic aluminium oxide J. Electrochem. Soc. 123 1479-86