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Volumn 10, Issue 2, 2010, Pages 646-651
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Wide-Bandgap III-V nitride based avalanche transit-time diode in Terahertz regime: Studies on the effects of punch through on high frequency characteristics and series resistance of the device
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Author keywords
High power; Punch through factor; SDR IMPATT; Series resistance; Terahertz device; Wz GaN
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Indexed keywords
HIGH POWER;
PUNCH THROUGH FACTOR;
SDR IMPATT;
SERIES RESISTANCE;
TERAHERTZ DEVICE;
WZ-GAN;
COMMUNICATION SYSTEMS;
CONVERSION EFFICIENCY;
DIODES;
GALLIUM ALLOYS;
GALLIUM NITRIDE;
INFORMATION RETRIEVAL;
OPTIMIZATION;
OSCILLATORS (ELECTRONIC);
SEMICONDUCTING GALLIUM;
IMPATT DIODES;
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EID: 70350707606
PISSN: 15671739
EISSN: None
Source Type: Journal
DOI: 10.1016/j.cap.2009.08.010 Document Type: Article |
Times cited : (16)
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References (20)
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