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Volumn 10, Issue 2, 2010, Pages 646-651

Wide-Bandgap III-V nitride based avalanche transit-time diode in Terahertz regime: Studies on the effects of punch through on high frequency characteristics and series resistance of the device

Author keywords

High power; Punch through factor; SDR IMPATT; Series resistance; Terahertz device; Wz GaN

Indexed keywords

HIGH POWER; PUNCH THROUGH FACTOR; SDR IMPATT; SERIES RESISTANCE; TERAHERTZ DEVICE; WZ-GAN;

EID: 70350707606     PISSN: 15671739     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.cap.2009.08.010     Document Type: Article
Times cited : (16)

References (20)
  • 8
    • 70350737144 scopus 로고    scopus 로고
    • M. Mukherjee, N. Mazumder, MRS Website: Symposium CC: Material and Material Structures Enabling Terahertz Technology: Paper No. 7.7 MRS Spring Meeting 2007, April 10-11, San Francisco, CA, USA, 2007.
    • M. Mukherjee, N. Mazumder, MRS Website: Symposium CC: Material and Material Structures Enabling Terahertz Technology: Paper No. 7.7 MRS Spring Meeting 2007, April 10-11, San Francisco, CA, USA, 2007.
  • 20
    • 70350711426 scopus 로고    scopus 로고
    • M. Mukherjee, S.K. Roy, in: Proceedings of IEEE International Symposium on Microwaves-2008, IEEE-ISM 08, December 4-6, Indian Institute of Science, IISc., Bangalore, India, 2008.
    • M. Mukherjee, S.K. Roy, in: Proceedings of IEEE International Symposium on Microwaves-2008, IEEE-ISM 08, December 4-6, Indian Institute of Science, IISc., Bangalore, India, 2008.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.