On process variation tolerant low cost thermal sensor design in 32nm CMOS technology

Proceedings of the ACM Great Lakes Symposium on VLSI, GLSVLSI

Volumn , Issue , 2009, Pages 487-492

  Remarsu, Spandana ^a   Kundu, Sandip ^a  

^a UNIVERSITY OF MASSACHUSETTS   (United States)

Author keywords

Dithering; Self Compensating Comparator; Thermal sensor

Indexed keywords

32 NM TECHNOLOGY; ACCURACY PROBLEMS; ACTIVE COMPENSATION; CMOS CIRCUITS; CMOS TECHNOLOGY; DESIGN ISSUES; DIGITAL DESIGNS; DITHERING; INTEGRAL PART; LOW AREA; LOW COSTS; LOW-POWER DISSIPATION; MANAGEMENT SYSTEMS; PORTABLE DEVICE; PROCESS VARIATION; SELF COMPENSATING COMPARATOR; SELF-CALIBRATION TECHNIQUES; SERVER SYSTEM; STAND -ALONE; TEST APPLICATION TIME; THERMAL MANAGEMENT; THERMAL SENSOR; THERMAL SENSORS;

CALIBRATION; CMOS INTEGRATED CIRCUITS; COMPARATORS (OPTICAL); LAKES; OPTICAL SENSORS;

DESIGN;

EID: 70350604176     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1145/1531542.1531653     Document Type: Conference Paper

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