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Volumn , Issue , 2007, Pages 304-309
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Advanced thermal sensing circuit and test techniques used in a high performance 65nm processor
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Author keywords
Analog design; Sensor calibration error; Temperature sensing; Thermal management
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Indexed keywords
ANALOG DESIGN;
ERROR CALIBRATION;
MICROPROCESSOR THROTTLING;
SENSOR CALIBRATION ERROR;
THERMAL DESIGN;
ANALOG CIRCUITS;
CALIBRATION;
ERROR ANALYSIS;
MICROPROCESSOR CHIPS;
TEMPERATURE CONTROL;
TEMPERATURE SENSORS;
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EID: 36948998952
PISSN: 15334678
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1145/1283780.1283845 Document Type: Conference Paper |
Times cited : (11)
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References (7)
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