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Volumn , Issue , 2007, Pages 3327-3330

Leakage-based on-chip thermal sensor for CMOS technology

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRONICS ENGINEERING; LEAKAGE CURRENTS; TEMPERATURE DISTRIBUTION; TEMPERATURE SENSORS;

EID: 34548849771     PISSN: 02714310     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/iscas.2007.378223     Document Type: Conference Paper
Times cited : (14)

References (10)
  • 1
    • 4444341299 scopus 로고    scopus 로고
    • Thermal Transient Modeling and Experimental Validation in the European Project PROFIT
    • September
    • H. Pape et al, "Thermal Transient Modeling and Experimental Validation in the European Project PROFIT," IEEE Transactions on Components and Packaging Technologies, vol. 27, no. 3, pp. 530-538, September 2004.
    • (2004) IEEE Transactions on Components and Packaging Technologies , vol.27 , Issue.3 , pp. 530-538
    • Pape, H.1
  • 2
    • 0035691287 scopus 로고    scopus 로고
    • Electro-Thermal CAD of Power Devices and Circuits with Fully Physical Time-Dependent Compact Thermal Modelling of Complex Non Linear 3-Dimensional Systems
    • December
    • W. Batty et al, "Electro-Thermal CAD of Power Devices and Circuits with Fully Physical Time-Dependent Compact Thermal Modelling of Complex Non Linear 3-Dimensional Systems," IEEE Transactions on Components and Packaging Technologies, vol. 24, no. 4, pp. 566-590, December 2001.
    • (2001) IEEE Transactions on Components and Packaging Technologies , vol.24 , Issue.4 , pp. 566-590
    • Batty, W.1
  • 3
    • 0037888441 scopus 로고    scopus 로고
    • Temperature sensors and voltage references implemented in CMOS technology
    • October
    • G. C. M. Meijer, G. Wang, and F. Fruett, "Temperature sensors and voltage references implemented in CMOS technology," IEEE Sensors Journal, vol. 1, no. 3, pp. 225-234, October 2001.
    • (2001) IEEE Sensors Journal , vol.1 , Issue.3 , pp. 225-234
    • Meijer, G.C.M.1    Wang, G.2    Fruett, F.3
  • 5
    • 23744475469 scopus 로고    scopus 로고
    • A Time-to-Digital-Converter-Based CMOS Smart Temperature Sensor
    • August
    • P. Chen, C.-C. Chen, C.-C. Tsa, and W.-F. Lu, "A Time-to-Digital-Converter-Based CMOS Smart Temperature Sensor," IEEE Journal of Solid-State Circuits, vol. 40, no. 8, pp. 1642-1648, August 2005.
    • (2005) IEEE Journal of Solid-State Circuits , vol.40 , Issue.8 , pp. 1642-1648
    • Chen, P.1    Chen, C.-C.2    Tsa, C.-C.3    Lu, W.-F.4
  • 6
    • 29044447504 scopus 로고    scopus 로고
    • A CMOS Smart Temperature Sensor with a 3σ Inaccuracy of ±0.1°C From -55 °C to 125°C
    • December
    • M. A. P. Pertijs, K. A. A. Makinwa, and J. H. Huijsing, "A CMOS Smart Temperature Sensor with a 3σ Inaccuracy of ±0.1°C From -55 °C to 125°C," IEEE Journal of Solid-State Circuits, vol. 40, no. 12, pp. 2805-2815, December 2005.
    • (2005) IEEE Journal of Solid-State Circuits , vol.40 , Issue.12 , pp. 2805-2815
    • Pertijs, M.A.P.1    Makinwa, K.A.A.2    Huijsing, J.H.3
  • 7
    • 0030188998 scopus 로고    scopus 로고
    • Micropower CMOS Temperature Sensor with Digital. Output
    • July
    • A. Bakker and J. H. Huijsing, "Micropower CMOS Temperature Sensor with Digital. Output," IEEE Journal of Solid-State Circuits, vol. 31, no. 7, pp. 933-937, July 1996.
    • (1996) IEEE Journal of Solid-State Circuits , vol.31 , Issue.7 , pp. 933-937
    • Bakker, A.1    Huijsing, J.H.2
  • 8
    • 4444254154 scopus 로고    scopus 로고
    • High Sensitive and Wide Detecting Range MOS Tunneling Temperature Sensors for On-Chip Temperature Detection
    • September
    • Y.-H. Shih, S.-R. Lin, T-M. Wang, and J.-G. Hwu, "High Sensitive and Wide Detecting Range MOS Tunneling Temperature Sensors for On-Chip Temperature Detection," IEEE Transactions on Electron Devices, vol. 51, no. 9, pp. 1514-1521, September 2004.
    • (2004) IEEE Transactions on Electron Devices , vol.51 , Issue.9 , pp. 1514-1521
    • Shih, Y.-H.1    Lin, S.-R.2    Wang, T.-M.3    Hwu, J.-G.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.