Integrated voltage reference and comparator circuits for GaN smart power chip technology

Proceedings of the International Symposium on Power Semiconductor Devices and ICs

Volumn , Issue , 2009, Pages 57-60

  Wong, King Yuen ^a   Chen, Wanjun ^a,b   Chen, Kevin J ^a  

^a HONG KONG UNIVERSITY OF SCIENCE AND TECHNOLOGY   (Hong Kong)

^b UNIVERSITY OF ELECTRONIC SCIENCE AND TECHNOLOGY OF CHINA   (China)

Author keywords

[No Author keywords available]

Indexed keywords

ALGAN/GAN HEMTS; FUNCTIONAL BLOCK; HIGH-VOLTAGES; INTEGRATED VOLTAGE; LOW-POWER CONSUMPTION; LOW-VOLTAGE; MIXED SIGNAL; MONOLITHICALLY INTEGRATED; PERIPHERAL DEVICES; POWER DEVICES; REFERENCE VOLTAGES; ROOM TEMPERATURE; SCHOTTKY DIODES; SENSING CIRCUITS; SMART POWER; SMART POWER APPLICATIONS; SUBTHRESHOLD; TEMPERATURE DEPENDENT; TEMPERATURE RANGE; VOLTAGE REFERENCE; WIDE BAND GAP;

COMPARATOR CIRCUITS; GALLIUM ALLOYS; GALLIUM NITRIDE; HIGH ELECTRON MOBILITY TRANSISTORS; MONOLITHIC INTEGRATED CIRCUITS; POWER ELECTRONICS; SCHOTTKY BARRIER DIODES; SEMICONDUCTOR DEVICE MANUFACTURE; SEMICONDUCTOR SWITCHES; VOLTAGE MEASUREMENT;

COMPARATORS (OPTICAL);

EID: 70350559542     PISSN: 10636854     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ISPSD.2009.5158000     Document Type: Conference Paper

References (8)

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