Scale-dependent nanomechanical behavior and anisotropic friction of nanotextured silicon surfaces

Journal of Materials Research

Volumn 24, Issue 10, 2009, Pages 3038-3043

  Zhang, Hanshen ^a   Komvopoulos, Kyriakos ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AFM; ANISOTROPIC FRICTION; ATOMIC FORCE MICROSCOPES; FRICTION COEFFICIENTS; INTERFACIAL ADHESIONS; ION BEAM IRRADIATION; NANO-MECHANICAL BEHAVIORS; NANO-SCALE SURFACES; NANOTEXTURED; NANOTEXTURED SURFACE; NANOTEXTURING; NORMAL LOADS; REAL CONTACT AREA; SILICON SURFACES; SLIDING DIRECTION; SLIDING FRICTION; SURFACE FORCE MICROSCOPE; TIP RADIUS;

ANISOTROPY; FRICTION; TRIBOLOGY; UNLOADING;

ATOMIC FORCE MICROSCOPY;

EID: 70350456319     PISSN: 08842914     EISSN: None     Source Type: Journal    
DOI: 10.1557/jmr.2009.0384     Document Type: Article

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