Combined analytical and phonon-tracking approaches to model thermal conductivity of etched and annealed nanoporous silicon

Advanced Engineering Materials

Volumn 11, Issue 10, 2009, Pages 852-861

  Randrianalisoa, Jaona ^a   Baillis, Dominique ^a  

^a UNIVERSITÉ DE LYON   (France)

Author keywords

[No Author keywords available]

Indexed keywords

PHONONS; SILICON;

ANALYTICAL APPROACH; INTRINSIC PROPERTY; NANO-POROUS SILICON; NANO-STRUCTURED; PHONON INTERACTIONS; PORE WALL; THICK MATERIALS; TRACKING APPROACHES;

THERMAL CONDUCTIVITY;

EID: 70350452967     PISSN: 14381656     EISSN: 15272648     Source Type: Journal    
DOI: 10.1002/adem.200900136     Document Type: Article

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