Mechanical characterization of nanowires based on optical diffraction images of the bent shape

Journal of Nanoscience and Nanotechnology

Volumn 9, Issue 8, 2009, Pages 4566-4574

  Muraoka, Mikio ^a   Tobe, Ryohei ^a  

^a AKITA UNIVERSITY   (Japan)

Author keywords

Mechanical test; Nanowire; Nonlinear mechanics; Optical diffraction image

Indexed keywords

CANTILEVER DEFLECTION; DIFFRACTION IMAGES; FLEXURAL RIGIDITIES; FRACTURE TEST; FREE END; GEOMETRICALLY NONLINEAR; INTENSE DEFORMATION; INTERACTIVE FORCES; INVERSE ANALYSIS; LARGE DEFLECTION; LASER INTERFEROMETER; LINEAR BEAM THEORY; MECHANICAL CHARACTERIZATIONS; MECHANICAL TEST; MICRO-CANTILEVERS; MICROSCOPIC OBSERVATIONS; NONLINEAR MECHANICS; OPTICAL DIFFRACTION IMAGE; OPTICAL DIFFRACTIONS; SUSPENDED PARTS; YOUNG'S MODULUS;

ATOMIC FORCE MICROSCOPY; BENDING STRENGTH; BUCKLING; COPPER OXIDES; DIFFRACTION; ELASTIC MODULI; ELASTICITY; ELECTRIC WIRE; FRACTURE TESTING; INTERFEROMETERS; LASER INTERFEROMETRY; NANOCANTILEVERS; NANOWIRES; POLYMER BLENDS; VAN DER WAALS FORCES;

FRACTURE;

EID: 70350400861     PISSN: 15334880     EISSN: None     Source Type: Journal    
DOI: 10.1166/jnn.2009.1079     Document Type: Article

References (38)

1. C. M. Lieber and Z. L. Wang, MRS Bulletin 32, 99 (2007).
2. P. Poncharal, Z. L: Wang, D. Ugarte, and W. A. de Heer, Science 283, 1513 (1999).
3. R. Gao, Z. L. Wang, Z. Bai, W. A. de Heer, L. Dai, and M. Gao, Phys. Rev. Lett. 85, 622 (2000).
4. C. Q. Chen, Y. Shi, Y. S. Zhang, J. Zhu, and Y. J. Yan, Phys. Rev. Lett. 96, 075505 (2006).
5. M. F. Yu, O. Lourie, M. J. Dyer, K. Moloni, T. F. Kelly, and R. S. Ruoff, Science 287, 637 (2000).
6. S. Hoffmann, I. Utke, B. Moser, J. Michler, S. H. Christiansen, V. Schmidt, S. Senz, P. Werner, U. Gösele, and C. Ballif, Nano Lett. 6, 622 (2006).
7. S. Okada, T. Mukawa, R. Kobayashi, M. Ishida, Y. Ochiai, T. Kaito, S. Matui, and J. Fujita, Jpn. J. Appl. Phys. 45, 5556 (2006).
8. S. Haffmann, F. Östlund, J. Michler, H. J. Fan, M. Zacharias, S. H. Christiansen, and C. Ballif, Nanotechnology 18, 205503 (2007).
9. S. Akita, H. Nishijima, T. Kishida, and Y. Nakayama, Jpn. J. Appl. Phys. 39, 3724 (2000).
10. J. Song, X. Wang, E. Riedo, and Z. L. Wang, Nano Lett. 5, 1954 (2005).
11. E. W. Wong, P. E. Sheehan, and C. M. Lieber, Science 277, 1971 (1997).
12. J. P. Salvetat, G. A. D. Briggs, J. M. Bonard, R. R. Bacsa, A. J. Kulik, T. Stöckli, N. A. Burnham, and L. Forró, Phys. Rev. Lett. 82, 944 (1999).
13. J. P. Salvetat, A. J. Kulik, J. M. Bonard, G. A. D. Briggs, T. Stöckli, K. Méténier, S. Bonnamy, F. Béguin, N. A. Burnham, and L. Forró, Adv. Mater. 11, 161 (1999).
14. A. Kis, D. Mihailovic, M. Remskar, A. Mrzel, A. Jesih, I. Piwonski, A. J. Kulik, W. Benoit, and L. Forró, Adv. Mater. 15, 733 (2003).
15. S. Cuenot, S. D. Champagne, and B. Nysten, Phys. Rev. Lett. 85, 1690 (2000).
16. B. Wu, A. Heidelberg, and J. J. Boland, Nat. Mater. 4, 525 (2005).
17. Q. Xiong, N. Duarte, S. Tadigadapa, and P. C. Eklund, Nano Lett. 6, 1904 (2006).
18. E. P. S. Tan, Y. Zhu, T. Yu, L. Dai, C. H. Sow, V. B. C. Tan, and C. T. Lim, Appl. Phys. Lett. 90, 163112 (2007).
19. D. A. Walters, L. M. Ericson, M. J. Casavant, J. Liu, D. T. Colbert, K. A. Smith, and R. E. Smalley, Appl. Phys. Lett. 74, 3803 (1999).
20. T. W. Tombler, C. Zhou, L. Alexseyev, J. Kong, H. Dai, L. Liu, C. S. Jayanthi, M. Tang, and S. Y. Wu, Nature 405, 769 (2000).
21. E. D. Minot, Y. Yaish, V. Sazonova, J. Y. Park, M. Brink, and P. L. McEuen, Phys. Rev. Lett. 90, 1564011 (2003).
22. M. R. Falvo, G. J. Clary, R. M. Taylar, II, V. Chi, F. P. Brooks, Jr., S. Washburn, and R. Superfine, Nature 389, 582 (1997).
23. X. D. Li, H. S. Gao, C. J. Murphy, and K. K. Caswell, Nano Lett. 3, 1495 (2003).
24. S. Cuenot, C. Frétigny, S. D. Champagne, and B. Nysten, Phys. Rev. B 69, 165410 (2004).
25. P. S. Timoshenko and D. H. Young, Elements of Strength of Materials, 5th edn., D. Van Nostrand Company, Inc., Tokyo (1981).
26. A. E. H. Love, A Treatise of the Mathematical Theory of Elasticity, 2nd edn., Cambridge University Press, Cambridge (1906).
27. X. Jiang, T. Herricks, and Y. Xia, Nano Lett. 2, 1333 (2002).
28. T. Yua, X. Zhaoa, Z. X. Shena, Y. H. Wub, and W. H. Sud, J. Cryst. Growth 268, 590 (2004).
29. M. Saka, F. Yamaya, and H. Tohmyoh, Scripta Mater. 56, 1031 (2007).
30. R. Wiesendanger, Scanning Probe Microscopy and Spectroscopy, Cambridge University Press, Cambridge (1994).
31. M. Muraoka, Proc. IPACK '01, The Pacific Rim/ASME Int. Electron. Packag. Technical Conf. and Exhibition, Paper No. 15600 (2001).
32. S. Wolfram, The Mathematica Book, 3rd edn., Wolfram Media and Cambridge University Press, Cambridge (1996).
33. R. C. Cammarata, Prog. Surf. Sci. 46, 1 (1994).
34. T. J. Chuang, Nanomechanics of Materials and Structures, edited by T. J. Chuang, P. M. Anderson, M. K. Wu, and S. Hsieh, Springer, Dordrecht (2006), p. 67.
35. M. Muraoka, Trans. ASME, J. Electron. Packag. 123, 70 (2001).
36. D. G. Holloway, The Physical Properties of Glass, Wykeham Publication, London (1973).
37. C. F. Bohren and D. R. Huffman, Absorption and Scattering of Light by Small Particles, A Wiley-Interscience Publication, New York (1983).
38. K. K. Sharma, Optics; Principles and Applications, Academic Press, Burlington (2006).