Rapid and mass growth of stress-induced nanowhiskers on the surfaces of evaporated polycrystalline Cu films

Scripta Materialia

Volumn 56, Issue 12, 2007, Pages 1031-1034

  Saka, Masumi ^a   Yamaya, Fumihiko ^a   Tohmyoh, Hironori ^a  

^a TOHOKU UNIVERSITY   (Japan)

Author keywords

Copper; Nanostructure; Stress induced migration; Thin films; Whiskers

Indexed keywords

COPPER; CRYSTAL GROWTH; FILM THICKNESS; NANOSTRUCTURED MATERIALS; POLYCRYSTALLINE MATERIALS; THIN FILMS;

INITIATION SITES; STRESS GRADIENTS; STRESS-INDUCED MIGRATION;

CRYSTAL WHISKERS;

EID: 34247104027     PISSN: 13596462     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.scriptamat.2007.02.036     Document Type: Article

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