Determination of trace impurities in boron nitride by graphite furnace atomic absorption spectrometry and electrothermal vaporization inductively coupled plasma optical emission spectrometry using solid sampling

Spectrochimica Acta - Part B Atomic Spectroscopy

Volumn 62, Issue 9, 2007, Pages 924-932

  Barth, P ^a   Hassler, J ^a   Kudrik, I ^b   Krivan, V ^c  

^a ESK Ceramics GmbH & Co KG   (Germany)

^b Faculty of Natural Sciences   (Slovakia)

^c UNIVERSITY OF ULM   (Germany)

Author keywords

Boron nitride; Electrothermal vaporization; Graphite furnace atomic absorption spectrometry; Inductively coupled plasma optical emission spectrometry; Solid sampling

Indexed keywords

BORON NITRIDE; CALIBRATION; SOLUTIONS; THERMAL EFFECTS; VAPORIZATION;

AQUEOUS STANDARD SOLUTIONS; ELECTROTHERMAL VAPORIZATION; GRAPHITE FURNACE ATOMIC ABSORPTION SPECTROMETRY (GFAAS); INDUCTIVELY COUPLED PLASMA OPTICAL EMISSION SPECTROMETRY; PLASMA SPECTROMETRY; PLASMA SPECTROMETRY OPTICAL EMISSION;

IMPURITIES;

EID: 34548612280     PISSN: 05848547     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.sab.2007.03.012     Document Type: Article

References (38)

1. R.Haubner M., Wilhelm R., and Weissenbacher B. Lux: boron nitrides - properties, synthesis and applications. In: Jansen M. (Ed). High Performance Non-Oxide Ceramics II (2002), Springer Verlag, Berlin, Heidelberg 1-45
2. Greim J., and Schwetz K.A. Boron carbide, boron nitride, and metal borides. Ullmann's Encyclopedia of Industrial Chemistry (2002), Wiley-VCH Verl., Weinheim
3. Krivan V., and Römmelt T. Determination of impurities in boron nitride powder by slurry sampling electrothermal atomic absorption spectrometry. J. Anal. At. Spectrom. 12 (1997) 137-141
4. Bock R. Handbuch der analytisch-chemischen Aufschlussmethoden (2001), Wiley-VCH Verlag, Weinheim
5. Hauptkorn S., and Krivan V. Determination of silicon in boron nitride by slurry sampling electrothermal atomic absorption spectrometry. Spectrochim. Acta Part B 49 (1994) 221-228
6. Lucic M., and Krivan V. Analysis of aluminium-based ceramic powders by electrothermal vaporization inductively coupled plasma atomic emission spectrometry using a tungsten coil and slurry sampling. Fresenius' J. Anal. Chem. 363 (1999) 64-72
7. Peng T., Chang G., Wang L., Jiang Z., and Hu B. Slurry sampling fluorination assisted electrothermal vaporization-inductively coupled plasma-atomic emission spectrometry for the direct determination of metal impurities in aluminium oxide ceramic powders. Fresenius' J Anal Chem. 369 (2001) 461-465
8. Tianyou Peng., Gang Chang., Xiaohai Sheng., Zucheng Jiang., and Bin Hu. Electrothermal vaporization-inductively coupled plasma-atomic emission spectrometry for the direct determination of trace amounts of impurities in slurries of silicon carbide. Anal. Chim. Acta 433 (2001) 255-262
9. Barth P., Hautkorn S., and Krivan V. Analysis of silicon dioxide and silicon nitride powders by electrothermal vaporization inductively coupled plasma atomic emission spectrometry using a tungsten coil and slurry sampling. J. Anal. At. Spectrom. 12 (1997) 1359-1365
10. Peng T., Jiang Z., Hu B., and Liao Z. Direct determination of trace copper and chromium in silicon nitride by fluorinating electrothermal vaporization inductively coupled plasma atomic emission spectrometry with the slurry sampling technique. Fresenius' J. Anal. Chem. 364 (1999) 551-555
11. Chen S., Wang L., Luo Z., Peng T., Hu B., and Jiang Z. In-situ separation of a matrix for the direct analysis of zirconium dioxide powder by electrothermal vaporization ICP-AES with a polytetrafluoroethylene slurry modifier. Anal. Sci. 16 (2000) 877-879
12. Broekaert A.C., Lathen C., Brandt R., Pilger C., Pollmann D., Tschöpel P., and Tölg G. The use of plasma atomic spectrometric methods for the analysis of ceramic powders. Fresenius' J. Anal. Chem. 349 (1994) 20-25
13. Lucic M., and Krivan V. Solid sampling electrothermal atomic absorption spectrometry for analysis of aluminium oxide powders. J. Anal. At. Spectrom. 13 (1998) 1133-1139
14. Wende M.C., and Broekaert J.A.C. Direct solid sampling electrothermal vaporization of alumina for analysis by inductively coupled plasma optical emission spectrometry. Spectrochim. Acta Part B 57 (2002) 1897-1904
15. Schäffer U., and Krivan V. Analysis of high purity graphite and silicon carbide by direct solid sampling electrothermal atomic absorption spectrometry. Fresenius' J. Anal. Chem. 371 (2001) 859-866
16. Zaray Gy., Leis F., Kantor T., Haßler J., and Tolg G. Analysis of silicon carbide powder by ETV-ICP-AES. Fresenius' J. Anal. Chem. 346 (1993) 1042-1046
17. Nickel H., Zadgorska Z., and Wolff G. Optimization of electrothermal vaporization of impurity elements in ceramic powders using inductively coupled plasma atomic emission spectroscopy. Spectrochim. Acta Part B 48 (1993) 25-38
18. Schäffer U., and Krivan V. Multielement analysis of graphite and silicon carbide by inductively coupled plasma atomic emission spectrometry using solid sampling and electrothermal vaporisation. Anal. Chem. 71 (1999) 849-854
19. Matschat R., Hassler J., Traub H., and Dette A. Multielement trace determination in silicon carbide powders: assessment of interlaboratory comparisons aimed at the validation and standardization of analytical procedures with direct solid sampling based on ETV ICP OES and DC arc OES. Anal. Bioanal. Chem. 383 (2005) 1060-1074
20. Hassler J., Zaray G., Schwetz K., and Florian K. Speciation of aluminium in silicon carbide by electrothermal vaporization-inductively coupled plasma atomic emission spectrometry. J. Anal. At. Spectrom. 20 (2005) 954-956
21. Hassler J., Detcheva A., Förster O., Perzl R., and Florian K. Working with a modern ETV-device and an ICP-CID-spectrometer. Ann. Chim. 89 (1999) 827-836
22. Huang M.D., and Krivan V. Direct solid sampling electrothermal atomic absorption spectrometry methods for the determination of silicon in oxides of niobium, titanium and zirconium. Spectrochim. Acta Part B 56 (2001) 1645-1656
23. Friese K.-Ch., Huang M.D., Schlemmer G., and Krivan V. A two-step atomizer system using a transversely heated furnace with Zeeman background correction: design and first applications. Spectrochim. Acta Part B 61 (2006) 1054-1062
24. Tianyou P., Pingwu D., Bin H., and Zucheng J. Direct analysis of titanium dioxide solid powder by fluorination assisted electrothermal vaporization inductively coupled plasma atomic emission spectrometry. Anal. Chim. Acta 421 (2000) 75-81
25. Krivan V., and Janickova P. A direct solid sampling electrothermal atomic absorption spectrometric method for determination of trace elements in zirconium dioxide. Anal. Bioanal. Chem. 382 (2005) 1949-1957
26. Docekal B., and Krivan V. Determination of trace impurities in powdered molybdenum metal and molybdenum silicide by solid sampling graphite furnace atomic absorption spectrometry. Spectrochim. Acta Part B 50 (1995) 517-526
27. Hornung M., and Krivan V. Determination of trace impurities in high purity tungsten by direct solid sampling electrothermal atomic absorption spectrometry using transversely heated graphite tube. Anal. Chem. 70 (1998) 3444-3451
28. Friese K.-Ch., and Krivan V. A solid sampling system for a transversely heated graphite furnace and its application to the trace element analysis of high purity tabtalum powders by atomic absorption spectrometry. Spectrochim. Acta Part B 53 (1998) 1069-1078
29. Friese K.-Ch., and Krivan V. Direct analysis of tantalum powders by electrothermal vaporization inductively coupled plasma atomic emission spectrometry. Fresenius' J. Anal. Chem. 364 (1999) 72-78
30. Gmelin Handbook of Inorganic and Organometallic Chemistry, 8th Edition., Boron Compounds, 4th Supplement, Vol. 3a, Boron and Nitrogen, Springer-Verlag, Berlin, 1991.
31. Dong H.M., and Krivan V. A solid sampling electrothermal atomic absorption spectrometry method for direct determination of silicon in titanium pieces. J. Anal. At. Spectrom. 18 (2003) 367-371
32. H.M.Dong, V. Krivan, A direct solid sampling electrothermal atomic absorption spectrometry method for the determination of silicon in biological materials, Spectrochim. Acta Part B 62 (2007) 297-303.
33. Krivan V., and Dong H.M. Direct analysis of pieces of materials by solid sampling electrothermal atomic absorption spectrometry demonstrated using high-purity titanium. Anal. Chem. 70 (1998) 5312-5321
34. Dong H.M., and Krivan V. Direct solid sampling electrothermal atomic absorption spectrometry for the analysis of high-purity niobium pentaoxide. Fresenius' J. Anal. Chem. 368 (2000) 227-234
35. Kantor T. Considerations in the gas flow design of a graphite furnace vaporization interface: effects of a halocarbon atmosphere and sample matrix. J. Anal. At. Spectrom. 7 (1992) 219-224
36. Schäffer U., and Krivan V. Multielement analysis of graphite and silicon carbide by inductively coupled plasma atomic emission spectrometry using solid sampling and electrothermal vaporisation. Anal. Chem. 71 (1999) 849-854
37. Kantor T., and de Loos-Vollebregt M.T.C. Carrier gas flow optimization for an end-on type of electrothermal vaporizer used for sample introduction in plasma source spectrometry. Spectrochim. Acta Part B 58 (2003) 1901-1916
38. 4 vapor in electrothermal vaporization inductively coupled plasma mass spectrometry. Spectrochim. Acta Part B 60 (2005) 333-343