Optical characterization of high-order 1-D silicon photonic crystals

IEEE Journal on Selected Topics in Quantum Electronics

Volumn 15, Issue 5, 2009, Pages 1359-1367

  Barillaro, Giuseppe ^a   Marsilio Strambini, Lucanos ^a   Annovazzi Lodi, Valerio ^b   Merlo, Sabina ^b  

^a UNIVERSITY OF PISA   (Italy)

^b UNIVERSITY OF PAVIA   (Italy)

Author keywords

Micromachining; Optical components; Optical device fabrication; Optical reflection; Photonic bandgap materials; Silicon

Indexed keywords

BAND GAPS; BAND-GAP EDGE; CHARACTERISTIC MATRICES; ELECTROCHEMICAL MICRO-MACHINING; EXPERIMENTAL DATA; HIGH ASPECT RATIO; HIGH-ORDER; IN-PLANE; LENSED FIBERS; LIMITED RESOLUTION; NEAR INFRARED REGION; NON-IDEALITIES; OPTICAL CHARACTERIZATION; OPTICAL COMPONENTS; OPTICAL DEVICE FABRICATION; OPTICAL PERFORMANCE; OPTICAL REFLECTION; OPTICAL SET-UP; PHOTONIC BANDGAP MATERIALS; POROSITY VARIATIONS; SILICON PHOTONIC CRYSTALS; SILICON WALLS; SINGLE-MODE OPTICAL FIBER; SPECTRAL REFLECTIVITY; THEORETICAL CALCULATIONS; WAVELENGTH RANGES;

ASPECT RATIO; COMPOSITE MICROMECHANICS; ENERGY GAP; MICROCOMPUTERS; MICROMACHINING; OPTICAL DEVICES; OPTICAL FIBER FABRICATION; OPTICAL FIBERS; OPTICAL INSTRUMENTS; PHOTONIC DEVICES; REFLECTION; SPECTRUM ANALYZERS; SPONTANEOUS EMISSION; SURFACE ROUGHNESS;

PHOTONIC CRYSTALS;

EID: 70350164635     PISSN: 1077260X     EISSN: None     Source Type: Journal    
DOI: 10.1109/JSTQE.2009.2017278     Document Type: Article

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