-
1
-
-
34948854470
-
Polymer self-assembly in semiconductor microelectronics
-
C. T. Black, et. al. Polymer self-assembly in semiconductor microelectronics. IBM Journal of Research and Development 51, 605-633 (2007).
-
(2007)
IBM Journal of Research and Development
, vol.51
, pp. 605-633
-
-
Black, C.T.1
-
2
-
-
33747091891
-
Block copolymer and conventional lithography
-
M. P. Stoykovich & P. F. Nealey, Block copolymer and conventional lithography. Materials Today 9, 20-29 (2006).
-
(2006)
Materials Today
, vol.9
, pp. 20-29
-
-
Stoykovich, M.P.1
Nealey, P.F.2
-
3
-
-
33749849660
-
Templated self-assembly of block copolymers: Top-down helps bottom-up
-
DOI 10.1002/adma.200502651
-
J. Y. Cheng, C. A. Ross, H. I. Smith & E. L. Thomas, Templated self-assembly of block copolymers: top-down helps bottom-up. Adv. Mater. 18, 2505-2521 (2006). (Pubitemid 44563465)
-
(2006)
Advanced Materials
, vol.18
, Issue.19
, pp. 2505-2521
-
-
Cheng, J.Y.1
Ross, C.A.2
Smith, H.I.3
Thomas, E.L.4
-
4
-
-
0141755407
-
Enabling nanotechnology with self assembled block copolymer patterns
-
C. Park, Y. Yoon, E. L. Thomas, Enabling nanotechnology with self assembled block copolymer patterns. Polymer, 44, 6725-6760 (2007).
-
(2007)
Polymer
, vol.44
, pp. 6725-6760
-
-
Park, C.1
Yoon, Y.2
Thomas, E.L.3
-
5
-
-
1842289819
-
11 holes in 1 square centimeter
-
DOI 10.1126/science.276.5317.1401
-
M. Park, C. Harrison, P. M. Chaikin, R. A. Register, and D. H. Adamson, Block copolymer lithography: periodic arrays of 1011 holes in 1 square centimeter. Science 276, 1401-1404 (1997). (Pubitemid 27235405)
-
(1997)
Science
, vol.276
, Issue.5317
, pp. 1401-1404
-
-
Park, M.1
Harrison, C.2
Chaikin, P.M.3
Register, R.A.4
Adamson, D.H.5
-
6
-
-
0031039786
-
-
P. Mansky, Y. Liu, E. Huang, T. P. Russell, C. J. Hawker, Science 275, 1458 (1997).
-
(1997)
Science
, vol.275
, pp. 1458
-
-
Mansky, P.1
Liu, Y.2
Huang, E.3
Russell, T.P.4
Hawker, C.J.5
-
7
-
-
0032480730
-
Using surface active random copolymers to control the domain orientation in diblock copolymer thin films
-
E. Huang, et al. Using surface active random copolymers to control the domain orientation in diblock copolymer thin films, Macromolecules, 31, 7641-7650 (1998). (Pubitemid 128557096)
-
(1998)
Macromolecules
, vol.31
, Issue.22
, pp. 7641-7650
-
-
Huang, E.1
Russell, T.P.2
Harrison, C.3
Chaikin, P.M.4
Register, R.A.5
Hawker, C.J.6
Mays, J.7
-
8
-
-
33748565316
-
Side-chain-grafted random copolymer brushes as neutral surfaces for controlling the orientation of block copolymer microdomains in thin films
-
DOI 10.1021/la060748g
-
I. In, Y-H, La, S-M. Park, P. F. Nealey, P. Gopalan, Side-chain-grafted random copolymer brushes as neutral surfaces for controlling the orientation of block copolymer microdomains in thin films. Langmuir, 22, 7855-7860 (2006). (Pubitemid 44373464)
-
(2006)
Langmuir
, vol.22
, Issue.18
, pp. 7855-7860
-
-
In, I.1
La, Y.-H.2
Park, S.-M.3
Nealey, P.F.4
Gopalan, P.5
-
9
-
-
37149046802
-
Imaging layers for the directed assembly of block copolymer films: Dependence of the physical and chemical properties of patterned polymer brushes on brush molecular weight
-
DOI 10.1116/1.2799970
-
K. O. Stuen, I. In, E. Han, J. A. Streifer, R. J. Hamers, P. F. Nealey, P. Gopalan, Imaging layers for the directed assembly of block copolymer films: Dependence of the physical and chemical properties of patterned polymer brushes on brush molecular weight, Journal of Vacuum Science and Technology B, 25, 1958-1962 (2007). (Pubitemid 350255817)
-
(2007)
Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures
, vol.25
, Issue.6
, pp. 1958-1962
-
-
Stuen, K.O.1
In, I.2
Han, E.3
Streifer, J.A.4
Hamers, R.J.5
Nealey, P.F.6
Gopalan, P.7
-
10
-
-
0034188632
-
Using self-assembled monolayers exposed to x-rays to control the wetting behavior of thin films of diblock copolymers
-
R. D. Peters, X. M. Yang, T. K. Kim, B. H. Sohn, P. F. Nealey, Using self-assembled monolayers exposed to x-rays to control the wetting behavior of thin films of diblock copolymers, Langmuir 16, 4625-4631 (2000).
-
(2000)
Langmuir
, vol.16
, pp. 4625-4631
-
-
Peters, R.D.1
Yang, X.M.2
Kim, T.K.3
Sohn, B.H.4
Nealey, P.F.5
-
11
-
-
0034316777
-
-
R. D. Peters, X. M. Yang, T. K. Kim, B. H. Sohn, P. F. Nealey,, Langmuir 16, 9620-9626 (2000).
-
(2000)
Langmuir
, vol.16
, pp. 9620-9626
-
-
Peters, R.D.1
Yang, X.M.2
Kim, T.K.3
Sohn, B.H.4
Nealey, P.F.5
-
12
-
-
0034315299
-
Combining advanced lithographic techniques and self-assembly of thin films of diblock copolymers to produce templates for nanofabrication
-
DOI 10.1116/1.1313572
-
R. D. Peters, X. M. Yang, Q. Wang, J. J. de Pablo, P. F. Nealey, Combining advanced lithographic techniques and self-assembly of thin films of diblock copolymers to produce templates for nanofabrication, Journal of Vacuum Science and Technology B, 18, 3530-3534 (2000). (Pubitemid 32088249)
-
(2000)
Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures
, vol.18
, Issue.6
, pp. 3530-3534
-
-
Peters, R.D.1
Yang, X.M.2
Wang, Q.3
De Pablo, J.J.4
Nealey, P.F.5
-
13
-
-
17644412836
-
A generalized approach to the modification of solid surfaces
-
DOI 10.1126/science.1106604
-
D. Y. Ryu, K. Shin, E. Drockenmuller, C. J. Hawker, T. P. Russell, A generalized approach to the modification of solid surfaces, Science, 308, 236-239 (2005). (Pubitemid 40558855)
-
(2005)
Science
, vol.308
, Issue.5719
, pp. 236-239
-
-
Ryu, D.Y.1
Shin, K.2
Drockenmuller, E.3
Hawker, C.J.4
Russell, T.P.5
-
14
-
-
34347344903
-
Surface modification with cross-linked random copolymers: Minimum effective thickness
-
DOI 10.1021/ma062939w
-
D. Y. Ryu et al. Surface modification with cross-linked random copolymers: minimum effective thickness, Macromolecules, 40, 4296-4300 (2007). (Pubitemid 47012586)
-
(2007)
Macromolecules
, vol.40
, Issue.12
, pp. 4296-4300
-
-
Ryu, D.Y.1
Wang, J.-Y.2
Lavery, K.A.3
Drockenmuller, E.4
Satija, S.K.5
Hawker, C.J.6
Russell, T.P.7
-
15
-
-
37549003631
-
Photopatternable imaging layers for controlling block copolymer microdomain orientation
-
E. Han, I. In, S.-M. Park, Y.-H. La, Y. Wang, P. F. Nealey, P Gopalan, Photopatternable imaging layers for controlling block copolymer microdomain orientation, Advanced Materials, 19, 4552-4557 (2007).
-
(2007)
Advanced Materials
, vol.19
, pp. 4552-4557
-
-
Han, E.1
In, I.2
Park, S.-M.3
La, Y.-H.4
Wang, Y.5
Nealey, P.F.6
Gopalan, P.7
-
16
-
-
37549045205
-
Facile routes to patterned surface neutralization layers for block copolymer lithography
-
J. Bang, J. Bae, P. Löwenhielm, C. Spiessberger, S. A. Given-Beck, T. P. Russell, C. J. Hawker, Facile routes to patterned surface neutralization layers for block copolymer lithography, Advanced Materials, 19, 4552-4557 (2007).
-
(2007)
Advanced Materials
, vol.19
, pp. 4552-4557
-
-
Bang, J.1
Bae, J.2
Löwenhielm, P.3
Spiessberger, C.4
Given-Beck, S.A.5
Russell, T.P.6
Hawker, C.J.7
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