Reliability aspects of SiC Schottky diodes

Physica Status Solidi (A) Applications and Materials Science

Volumn 206, Issue 10, 2009, Pages 2295-2307

  Holz, Matthias ^a   Hilsenbeck, Jochen ^b   Rupp, Roland ^a  

^a INFINEON TECHNOLOGIES AG   (Germany)

^b INFINEON TECHNOLOGIES AUSTRIA AG   (Austria)

Author keywords

[No Author keywords available]

Indexed keywords

DEVICE DESIGN; DEVICE PROPERTIES; DEVICE RELIABILITY; ELECTRICAL PROPERTY; HIGH VOLTAGE; HIGH-FREQUENCY APPLICATIONS; HIGH-VOLTAGES; INFINEONS; MARKET SHARE; MATERIAL PROPERTY; MEASUREMENT RESULTS; NEW DEVICES; PACKAGING TECHNOLOGIES; POWER DEVICES; POWER SUPPLY; SIC DEVICES; SIC SCHOTTKY DIODE; SOLAR INVERTER; STRESS TEST;

COMPETITION; DIODES; ELECTRIC EQUIPMENT; ELECTRIC POWER SYSTEMS; ELECTRIC PROPERTIES; LIGHT EMITTING DIODES; RELIABILITY; SCHOTTKY BARRIER DIODES; SILICON CARBIDE; SPREADSHEETS;

SEMICONDUCTING SILICON COMPOUNDS;

EID: 70350018037     PISSN: 18626300     EISSN: 18626319     Source Type: Journal    
DOI: 10.1002/pssa.200925083     Document Type: Article

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