Fabrication and thermal evolution of nanoparticles in SiO2 by Zn ion implantation

Journal of Crystal Growth

Volumn 311, Issue 21, 2009, Pages 4605-4609

  Shen, Yanyan ^a   Li, Xu ^a   Wang, Zhuo ^a   Zhang, Lili ^a   Zhang, Dacheng ^a   Li, Mengkai ^a   Yuan, Bing ^a   Li, Zhaodong ^a   Liu, Changlong ^a,b  

^a TIANJIN UNIVERSITY   (China)

^b Institute of Advanced Materials Physics Faculty of Science   (China)

Author keywords

A1. Atomic force microscopy; A1. X ray diffraction; B1. Nanomaterials; B1. Oxides; B1. Zinc compounds; B2. Semiconducting II VI materials

Indexed keywords

A1. ATOMIC FORCE MICROSCOPY; A1. X-RAY DIFFRACTION; B1. NANOMATERIALS; B1. OXIDES; B1. ZINC COMPOUNDS; B2. SEMICONDUCTING II-VI MATERIALS;

ANNEALING; ATOMIC FORCE MICROSCOPY; ATOMIC SPECTROSCOPY; DIFFRACTION; ION BOMBARDMENT; ION IMPLANTATION; NANOPARTICLES; NANOSTRUCTURED MATERIALS; OXYGEN; RUTHERFORD BACKSCATTERING SPECTROSCOPY; SEMICONDUCTOR GROWTH; SILICON COMPOUNDS; X RAY DIFFRACTION; ZINC; ZINC COMPOUNDS; ZINC OXIDE;

X RAY DIFFRACTION ANALYSIS;

EID: 70349775644     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jcrysgro.2009.08.029     Document Type: Article

References (29)

1. Meldrum A., Sonder E., Zuhr R.A., Anderson I.M., Budai J.D., White C.W., Boatner L.A., and Henderson D.O. J. Mater. Res. 14 (1999) 4489
2. Brongerma M.L., Hartman J.L., and Atwater H.A. Phys. Rev. B 62 (2000) R16356
3. Flytzanis C., Hache F., Klein M.C., Ricard D., and Roussignol Ph. In: Wolf E. (Ed). Prog. Optics 29 (1999), North-holland, Amsterdam 321
4. Meldrum A., Haglund Jr. R.F., Boatner L.A., and Woody White C. Adv. Mater. 13 (2001) 1431
5. Chin S., et al. J. Cryst. Growth 293 (2006) 344
6. Look D.C., Reynolds D.C., Litton C.W., Jones R.L., Eason D.B., and Cantwell G. Appl. Phys. Lett. 81 (2002) 1830
7. De G., Tapfer L., Catalano M., Battaglin G., Condlla F., Mazzoldi P., and Haglund R.F. Appl. Phys. Lett. 68 (1996) 3820
8. M Ballesteros J., Serna R., Solis J., Afonoso C.N., pteford-long A.K., Osborne D.H., and Haglund R.F. Appl. Phys. Lett. 71 (1997) 2409
9. Amekura H., Umeda N., Takeda Y., Lu J., and Kishimoto N. Appl. Phys. Lett. 85 (2004) 1015
10. Mazzoldi P., and Mattei G. Phys. Status Solidi (a) 204 (2007) 621
11. Kluth P., Hoy B., Johannessen B., Dunn S.G., Foran G.J., and Ridgway M.C. Nucl Instrum Methods. Res. B 257 (2007) 80
12. Zu P., Tang Z.K., Wong G.K.L., Kawasaki M., Ohtomo A., Koinuma H., and Segawa Y. Solid State Commun. 103 (1997) 459
13. Amekura H., Ohnuma M., Kishimoto N., Buchal Ch., and Mantl S. J. Appl. Phys. Lett. 104 (2008) 114309
14. Ziegler J.F., Biersack J.P., and Littmark U. The Stopping and Range of Ions in Solid (1985), Pergamon, New York. http://www.srim.org/ (Chapter 8) 〈http://www.srim.org/〉
15. Xiang X., Zu X.T., Zhu S., Wei Q.M., Zhang C.F., and Sun K. Lm. Nanotechnol. 17 (2006) 2636
16. van Huis M.A., van Veen A., Schut H., Kooi B.J., De Hosson J.Th.M., Du X.S., Hibma T., and Fromknecht R. Nucl. Instrum. Methods B 216 (2004) 390
17. Chen J., Mu R., Ueda A., Wu M.H., Tung Y.-S., Gu Z., Henderson D.O., White C.W., Budai J.D., and Zuhr R.A. J. Vac. Sci. Technol. A 16 (1998) 1409
18. Van Huis M.A., van Veen A., Schut H., Kooi B.J., De Hosson J.Th., Du X.S., Hibma T., and Fromknecht R. Nucl. Instrum. Methods B 216 (2004) 390
19. Ribeiro C., Lee E.J.H., Giraldi T.R., Varela J.A., Longo E., and Leite E.R. J. Phys. Chem. B 108 (2004) (15 612)
20. Lammer H., and Bauer S.J. Planet. Space Sci. 45 (1997) 73
21. Stepanov A.L., and Popok V.N. Surf. Sci. 566-568 (2004) 1250
22. Amekura H., Plaksin O.A., Kishimoto N., and Buchal Ch. Surf. Coat. Technol. 201 (2007) 8215
23. Williams E.L. J. Am. Ceram. Soc. 48 (1965) 190
24. Amekura H., Plaksin O.A., Yoshitake M., Takeda Y., and Kishimoto N. Appl. Phys. Lett. 89 (2006) 023115
25. Bukharaev A.A., Janduganov V.M., Samarsky E.A., and Berdunov N.V. Appl. Surf. Sci. 103 (1996) 49
26. Lee M.K., and Tu H.F. J. Appl. Phys. 101 (2007) 126103
27. Tagliente M.A., Massaro M., Mattei G., Mazzoldi P., Bello V., and Pellegrini G. J. Appl. Phys. 104 (2008) 093505
28. Xiang X., ZUS Zhu X.T., Zhang C.F., and Wang L.M. Nucl. Instrum. Methods Phys. Res. B 250 (2006) 192
29. Liu Y.X., Liu Y.C., Shen D.Z., Zhong G.Z., Fan X.W., Kong X.G., Mu R., and Henderson D.O. Solid State Commun. 121 (2002) 531