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Volumn 104, Issue 9, 2008, Pages

Size-dependent oxidation in ZnO nanoparticles embedded in ion-implanted silica

Author keywords

[No Author keywords available]

Indexed keywords

ABSORPTION; ABSORPTION SPECTROSCOPY; ANNEALING; CHEMICAL OXYGEN DEMAND; DIFFRACTION; ELECTROMAGNETIC WAVE ABSORPTION; ENERGY ABSORPTION; INTEGRATED OPTOELECTRONICS; LANTHANUM COMPOUNDS; LIGHT ABSORPTION; LIGHT EMISSION; LUMINESCENCE; MICROSCOPIC EXAMINATION; NANOPARTICLES; NANOSTRUCTURED MATERIALS; OPTICAL MICROSCOPY; OXIDATION; PHOTOLUMINESCENCE; SEMICONDUCTING ZINC COMPOUNDS; SILICA; SURFACE DIFFUSION; ZINC; ZINC ALLOYS; ZINC OXIDE;

EID: 56349153247     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3005887     Document Type: Article
Times cited : (11)

References (34)
  • 5
    • 0030084093 scopus 로고    scopus 로고
    • 0036-8075 10.1126/science.271.5251.933.
    • A. P. Alivisatos, Science 0036-8075 10.1126/science.271.5251.933 271, 933 (1996).
    • (1996) Science , vol.271 , pp. 933
    • Alivisatos, A.P.1
  • 7
    • 0000291742 scopus 로고
    • 0163-1829 10.1103/PhysRevB.50.15424.
    • J. Zhao, X. Chen, and G. Wang, Phys. Rev. B 0163-1829 10.1103/PhysRevB.50.15424 50, 15424 (1994).
    • (1994) Phys. Rev. B , vol.50 , pp. 15424
    • Zhao, J.1    Chen, X.2    Wang, G.3
  • 8
    • 0011724004 scopus 로고    scopus 로고
    • 0163-1829 10.1103/PhysRevB.55.13865.
    • D. -L. Lu and K. -I. Tanaka, Phys. Rev. B 0163-1829 10.1103/PhysRevB.55. 13865 55, 13865 (1997).
    • (1997) Phys. Rev. B , vol.55 , pp. 13865
    • Lu, D.-L.1    Tanaka, K.-I.2
  • 9
    • 33645620497 scopus 로고
    • 1050-2947 10.1103/PhysRevA.13.2287.
    • Ph. Buffat and J. -P. Borel, Phys. Rev. A 1050-2947 10.1103/PhysRevA.13. 2287 13, 2287 (1976).
    • (1976) Phys. Rev. A , vol.13 , pp. 2287
    • Buffat, Ph.1    Borel, J.-P.2
  • 12
    • 18144362876 scopus 로고    scopus 로고
    • 0031-9007 10.1103/PhysRevLett.94.107601.
    • A. M. Bratkovsky and A. P. Levanyuk, Phys. Rev. Lett. 0031-9007 10.1103/PhysRevLett.94.107601 94, 107601 (2005).
    • (2005) Phys. Rev. Lett. , vol.94 , pp. 107601
    • Bratkovsky, A.M.1    Levanyuk, A.P.2
  • 13
    • 0141775174 scopus 로고
    • 0003-6951 10.1063/1.103561.
    • L. T. Canham, Appl. Phys. Lett. 0003-6951 10.1063/1.103561 57, 1046 (1990).
    • (1990) Appl. Phys. Lett. , vol.57 , pp. 1046
    • Canham, L.T.1
  • 14
    • 0035240739 scopus 로고    scopus 로고
    • 0001-8732 10.1080/00018730010006608.
    • A. D. Yoffe, Adv. Phys. 0001-8732 10.1080/00018730010006608 50, 1 (2001).
    • (2001) Adv. Phys. , vol.50 , pp. 1
    • Yoffe, A.D.1
  • 15
    • 2342435543 scopus 로고    scopus 로고
    • 0163-1829 10.1103/PhysRevB.69.125304.
    • S. Sapra and D. D. Sarma, Phys. Rev. B 0163-1829 10.1103/PhysRevB.69. 125304 69, 125304 (2004).
    • (2004) Phys. Rev. B , vol.69 , pp. 125304
    • Sapra, S.1    Sarma, D.D.2
  • 20
  • 21
  • 24
    • 9144248499 scopus 로고    scopus 로고
    • 0022-3727 10.1088/0022-3727/37/21/013.
    • Y. X. Liu, Y. C. Liu, C. L. Shao, and R. Mu, J. Phys. D 0022-3727 10.1088/0022-3727/37/21/013 37, 3025 (2004).
    • (2004) J. Phys. D , vol.37 , pp. 3025
    • Liu, Y.X.1    Liu, Y.C.2    Shao, C.L.3    Mu, R.4
  • 28
    • 56349156337 scopus 로고    scopus 로고
    • ICDD Card No. 87-0713.
    • ICDD Card No. 87-0713.
  • 29
    • 56349108330 scopus 로고    scopus 로고
    • ICDD Card No. 79-2205.
    • ICDD Card No. 79-2205.
  • 30
    • 0041336894 scopus 로고    scopus 로고
    • 0163-1829 10.1103/PhysRevB.68.045313.
    • R. T. Senger and K. K. Bajaj, Phys. Rev. B 0163-1829 10.1103/PhysRevB.68. 045313 68, 045313 (2003).
    • (2003) Phys. Rev. B , vol.68 , pp. 045313
    • Senger, R.T.1    Bajaj, K.K.2
  • 33
    • 0004276325 scopus 로고
    • in, edited by B. Ilschner and N. J. Grant (Springer, New York).
    • I. C. Noyan and J. B. Cohen, in Residual Stresses, edited by, B. Ilschner, and, N. J. Grant, (Springer, New York, 1987).
    • (1987) Residual Stresses
    • Noyan, I.C.1    Cohen, J.B.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.