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Volumn 106, Issue 6, 2009, Pages

Internal residual stress studies and enhanced dielectric properties in La0.7 Sr0.3 CoO3 buffered (Ba,Sr) TiO3 thin films

(2) Lu, Shengbo a Xu, Zhengkui a

a CITY UNIVERSITY OF HONG KONG (Hong Kong)

Author keywords

[No Author keywords available]

Indexed keywords

BST THIN FILMS; DIELECTRIC CONSTANTS; GRAIN SIZE; LOSS TANGENT; PREFERRED ORIENTATIONS; PT(111); RANDOM ORIENTATIONS; SI SUBSTRATES; TENSILE RESIDUAL STRESS; THERMAL EXPANSION COEFFICIENTS; TUNABILITIES; X-RAY DIFFRACTION STUDIES;

BARIUM; CERAMIC CAPACITORS; DIELECTRIC PROPERTIES; PLATINUM; PULSED LASER DEPOSITION; RESIDUAL STRESSES; THERMAL EXPANSION; THIN FILM DEVICES; TITANIUM OXIDES;

THIN FILMS;

EID: 70349646112 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.3223325 Document Type: Article

Times cited : (8)

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