Effect of thermal strain on the ferroelectric phase transition in polycrystalline Ba 0.5Sr 0.5TiO 3 thin films studied by Raman spectroscopy

Applied Physics Letters

Volumn 85, Issue 18, 2004, Pages 4124-4126

  Tenne, D A ^a   Soukiassian, A ^a   Xi, X X ^a   Taylor, T R ^b   Hansen, P J ^b   Speck, J S ^b   York, R A ^b  

^a PENNSYLVANIA STATE UNIVERSITY   (United States)

^b University of California   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BIAXIAL TENSILE STRAIN; FERROELECTRIC PHASE TRANSITION; FILM MICROSTRUCTURE; THERMAL STRAIN;

BARIUM COMPOUNDS; FERROELECTRIC MATERIALS; MAGNETRON SPUTTERING; MICROSTRUCTURE; PHASE TRANSITIONS; POLYCRYSTALLINE MATERIALS; RAMAN SPECTROSCOPY; STRAIN;

THIN FILMS;

EID: 10044259898     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1813625     Document Type: Article

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