Light scattering near and from interfaces using evanescent wave and ellipsometric light scattering

Current Opinion in Colloid and Interface Science

Volumn 14, Issue 6, 2009, Pages 426-437

  Sigel, Reinhard ^a  

^a UNIVERSITY OF FRIBOURG   (Switzerland)

Author keywords

Adsorption at an interface; Colloidal interfaces; Dynamic light scattering; Ellipsometric light scattering; Ellipsometry; Evanescent wave; Interfacial dynamics; Liquid crystalline anchoring; Liquid interface; Mie scattering; Polymer brush; Roughness; Surface fluctuations; Wall drag effect on diffusion

Indexed keywords

COLLOIDAL INTERFACES; ELLIPSOMETRIC LIGHT SCATTERING; EVANESCENT WAVE; INTERFACIAL DYNAMICS; LIQUID CRYSTALLINE ANCHORING; LIQUID INTERFACE; MIE SCATTERING; POLYMER BRUSH; ROUGHNESS; SURFACE FLUCTUATIONS; WALL DRAG EFFECT ON DIFFUSION;

ADSORPTION; BRILLOUIN SCATTERING; BRUSHES; COLLOID CHEMISTRY; COMPUTATIONAL FLUID DYNAMICS; DRAG; DYNAMIC LIGHT SCATTERING; ELECTROMAGNETIC WAVE REFLECTION; ELLIPSOMETRY; LIQUID CRYSTAL POLYMERS; LIQUID CRYSTALS; POLYMERS; REFRACTION; SURFACE DIFFUSION; WALLS (STRUCTURAL PARTITIONS);

SCATTERING;

POLYMER;

COLLOID; ELLIPSOMETRY; EVANESCENT WAVE LIGHT SCATTERING; LIGHT; LIGHT SCATTERING; LIQUID; LIQUID CRYSTAL; REVIEW; SOLID; STRUCTURE ANALYSIS;

EID: 70349426979     PISSN: 13590294     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.cocis.2009.08.004     Document Type: Review

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