Rayleigh-mie scattering ellipsometry as an in situ diagnostic for the production of "smart nanoparticles"

Physica Status Solidi (A) Applications and Materials Science

Volumn 205, Issue 4, 2008, Pages 802-805

  Weiß, Raphaela ^a   Hong, Suk Ho ^b   Ränsch, Jens ^a   Winter, Jörg ^a  

^a RUHR UNIVERSITY BOCHUM   (Germany)

^b IRFM   (France)

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS HYDROGENATED CARBONS; COMPLEX REFRACTIVE INDICES; GROWTH PROCESSES; IN DEPENDENCES; IN SITU DIAGNOSTICS; IN-SITU; INTERNAL STRUCTURES; MIE SCATTERINGS; MULTIPLE WAVELENGTHS; PARTICLE RADIUSES; RAYLEIGH; SMART NANOPARTICLES;

ACETYLENE; AMORPHOUS CARBON; BRILLOUIN SCATTERING; CARBON NITRIDE; ELLIPSOMETRY; LIGHT SCATTERING; LIGHTING; NANOPARTICLES; NANOSTRUCTURED MATERIALS; NITRIDES; OPTICAL CONSTANTS; OPTICAL PROPERTIES; REFRACTIVE INDEX;

NANOSTRUCTURES;

EID: 54849406434     PISSN: 18626300     EISSN: 18626319     Source Type: Journal    
DOI: 10.1002/pssa.200777803     Document Type: Article

References (9)

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