Influence of surface energy and relative humidity on AFM nanomechanical contact stiffness

Applied Surface Science

Volumn 253, Issue 3, 2006, Pages 1274-1281

  Hurley, D C ^a   Kopycinska Muller M ^a   Julthongpiput, D ^a   Fasolka, M J ^a  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

Atomic force microscopy (AFM); Nanomechanics; Self assembled monolayer (SAM)

Indexed keywords

ATMOSPHERIC HUMIDITY; ATOMIC FORCE MICROSCOPY; NANOSTRUCTURED MATERIALS; SELF ASSEMBLY; SURFACE ROUGHNESS; VISCOELASTICITY;

ATOMIC FORCE ACOUSTIC MICROSCOPY (AFAM); CONTACT STIFFNESS; NANOMECHANICS; SCANNED PROBE MICROSCOPY (SPM);

INTERFACIAL ENERGY;

EID: 33750726058     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2006.01.072     Document Type: Article

References (13)

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