Quadratic backward propagation of variance for nonlinear statistical circuit modeling

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

Volumn 28, Issue 9, 2009, Pages 1428-1432

  Stevanović, Ivica ^a,b   McAndrew, Colin C ^c  

^a ABB CORPORATE RESEARCH   (Switzerland)

^b EPFL   (Switzerland)

^c FREESCALE SEMICONDUCTOR INC   (United States)

Author keywords

Backward propagation of variance (BPV); Nonlinear devices; Semiconductor device modeling; Statistical modeling

Indexed keywords

BACKWARD PROPAGATION; BACKWARD PROPAGATION OF VARIANCE (BPV); CIRCUIT MODELING; DEVICE PERFORMANCE; ELECTRICAL PERFORMANCE; IC MANUFACTURING TECHNOLOGIES; LINEAR FUNCTIONS; MANUFACTURING VARIATION; NON-LINEARITY; NONLINEAR DEVICES; POSSIBLE SOLUTIONS; PROCESS PARAMETERS; SEMICONDUCTOR DEVICE MODELING; STATISTICAL FLUCTUATIONS; STATISTICAL MODELING; STOCHASTIC VARIATION; TECHNOLOGY SCALING;

INDUSTRIAL APPLICATIONS; INTEGRATED CIRCUITS; SEMICONDUCTOR DEVICE MANUFACTURE; SEMICONDUCTOR SWITCHES; STATISTICS;

SEMICONDUCTOR DEVICE MODELS;

EID: 69649102511     PISSN: 02780070     EISSN: None     Source Type: Journal    
DOI: 10.1109/TCAD.2009.2023194     Document Type: Article

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