Statistical analysis of analog structures through variance calculation

IEEE Transactions on Circuits and Systems I: Fundamental Theory and Applications

Volumn 49, Issue 8, 2002, Pages 1071-1078

  Graupner, Achim ^a,b   Schwarz, Wolfgang ^a,b   Schüffny, René ^b  

^a IEEE   (Germany)

^b DRESDEN UNIVERSITY OF TECHNOLOGY   (Germany)

Author keywords

Sensitivity; Statistical analysis; Tolerance analysis; Variance calculation

Indexed keywords

ANALOG INTEGRATED CIRCUITS; RANDOM DEVICES; VARIANCE ANALYSIS;

AMPLIFIERS (ELECTRONIC); ELECTRIC FILTERS; ELECTRIC NETWORK ANALYSIS; STATISTICAL METHODS; TRANSCONDUCTANCE;

INTEGRATED CIRCUITS;

EID: 0036691897     PISSN: 10577122     EISSN: None     Source Type: Journal    
DOI: 10.1109/TCSI.2002.801260     Document Type: Article

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