Statistical modeling for circuit simulation

Proceedings - International Symposium on Quality Electronic Design, ISQED

Volumn 2003-January, Issue , 2003, Pages 357-362

  McAndrew, Colin C ^a  

^a MOTOROLA INC   (United States)

Author keywords

Circuit optimization; Circuit simulation; Digital circuits; Integrated circuit modeling; Manufacturing processes; MOSFET circuits; Predictive models; Robustness; Solid modeling; Virtual manufacturing

Indexed keywords

AGILE MANUFACTURING SYSTEMS; CIRCUIT SIMULATION; DIGITAL CIRCUITS; DIGITAL INTEGRATED CIRCUITS; ELECTRIC NETWORK TOPOLOGY; MANUFACTURE; ROBUSTNESS (CONTROL SYSTEMS); STATISTICAL METHODS; TOPOLOGY;

CIRCUIT OPTIMIZATION; INTEGRATED CIRCUIT MODELING; MANUFACTURING PROCESS; MOSFET CIRCUITS; PREDICTIVE MODELS; SOLID MODEL; VIRTUAL MANUFACTURING;

STATISTICS;

EID: 84942123096     PISSN: 19483287     EISSN: 19483295     Source Type: Conference Proceeding    
DOI: 10.1109/ISQED.2003.1194758     Document Type: Conference Paper

References (5)

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