Statistical device models from worst case files and electrical test data

IEEE Transactions on Semiconductor Manufacturing

Volumn 12, Issue 4, 1999, Pages 470-484

  Singhal, Kumud ^b   Visvanathan, V ^a,c  

^a IEEE

^b LUCENT TECHNOLOGIES   (United States)

^c CADENCE DESIGN SYSTEMS   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; SEMICONDUCTOR DEVICE MANUFACTURE; SEMICONDUCTOR DEVICE MODELS; STATISTICAL METHODS;

DESIGN FOR MANUFACTURABILITY; PRINCIPAL COMPONENT ANALYSIS (PCA); STATISTICAL DEVICE MODELS;

MOS DEVICES;

EID: 0033350553     PISSN: 08946507     EISSN: None     Source Type: Journal    
DOI: 10.1109/66.806125     Document Type: Article

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