Statistical modeling for a 0.6 μm BiCMOS technology

Proceedings of the IEEE Bipolar/BiCMOS Circuits and Technology Meeting

Volumn , Issue , 1997, Pages 24-27

  Power, James A ^a   Kelly, Sean C ^a   Griffith, Edel C ^a   Doyle, Denis ^a   O'Neill, Mike ^a  

^a Analog Devices Inc UK   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

BIPOLAR INTEGRATED CIRCUITS; COMPUTER SIMULATION; COMPUTER SOFTWARE; INTEGRATED CIRCUIT TESTING; SEMICONDUCTOR DEVICE MODELS; STATISTICAL METHODS;

SOFTWARE PACKAGE SPICE;

CMOS INTEGRATED CIRCUITS;

EID: 0031338414     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (5)