메뉴 건너뛰기




Volumn 57, Issue 3, 2009, Pages 1015-1021

Simple linear profiles monitoring in the presence of within profile autocorrelation

Author keywords

Autocorrelation; Average run length; Phase II; Profile monitoring; Statistical process control

Indexed keywords

AVERAGE RUN LENGTH; AVERAGE RUN LENGTHS; CONTROL CHARTS; FIRST ORDER AUTOREGRESSIVE MODEL; LINEAR PROFILES; PHASE II; POOR PERFORMANCE; PROFILE MONITORING; REGRESSION PARAMETERS; REMEDIAL MEASURES; SIMPLE LINEAR REGRESSION; SPATIAL AUTOCORRELATIONS;

EID: 69649085029     PISSN: 03608352     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.cie.2009.04.005     Document Type: Article
Times cited : (105)

References (32)
  • 1
    • 0003084462 scopus 로고
    • An EWMA for monitoring a process standard deviation
    • Crowder S.V., and Hamilton M.D. An EWMA for monitoring a process standard deviation. Journal of Quality Technology 24 1 (1992) 12-21
    • (1992) Journal of Quality Technology , vol.24 , Issue.1 , pp. 12-21
    • Crowder, S.V.1    Hamilton, M.D.2
  • 2
    • 33746120768 scopus 로고    scopus 로고
    • Phase I analysis for monitoring nonlinear profiles in manufacturing processes
    • Ding Y., Zeng L., and Zhou S. Phase I analysis for monitoring nonlinear profiles in manufacturing processes. Journal of Quality Technology 38 3 (2006) 199-216
    • (2006) Journal of Quality Technology , vol.38 , Issue.3 , pp. 199-216
    • Ding, Y.1    Zeng, L.2    Zhou, S.3
  • 3
    • 33745007601 scopus 로고    scopus 로고
    • Performance evaluation of two methods for online monitoring of linear calibration profiles
    • Gupta S., Montgomery D.C., and Woodall W.H. Performance evaluation of two methods for online monitoring of linear calibration profiles. International Journal of Production Research 44 10 (2006) 1927-1942
    • (2006) International Journal of Production Research , vol.44 , Issue.10 , pp. 1927-1942
    • Gupta, S.1    Montgomery, D.C.2    Woodall, W.H.3
  • 4
    • 62949159524 scopus 로고    scopus 로고
    • Profile monitoring via nonlinear mixed model
    • Jensen W.A., and Birch J.B. Profile monitoring via nonlinear mixed model. Journal of Quality Technology 41 1 (2009) 18-34
    • (2009) Journal of Quality Technology , vol.41 , Issue.1 , pp. 18-34
    • Jensen, W.A.1    Birch, J.B.2
  • 5
    • 41249101111 scopus 로고    scopus 로고
    • Monitoring correlation within linear profiles using mixed models
    • Jensen W.A., Birch J.B., and Woodall W.H. Monitoring correlation within linear profiles using mixed models. Journal of Quality Technology 40 2 (2008) 167-183
    • (2008) Journal of Quality Technology , vol.40 , Issue.2 , pp. 167-183
    • Jensen, W.A.1    Birch, J.B.2    Woodall, W.H.3
  • 6
    • 0033276876 scopus 로고    scopus 로고
    • Feature-preserving data compression of stamping tonnage information using wavelets
    • Jin J., and Shi J. Feature-preserving data compression of stamping tonnage information using wavelets. Technometrics 41 4 (1999) 327-339
    • (1999) Technometrics , vol.41 , Issue.4 , pp. 327-339
    • Jin, J.1    Shi, J.2
  • 7
    • 1642541495 scopus 로고    scopus 로고
    • On-line monitoring when the process yields a linear profile
    • Kang L., and Albin S.L. On-line monitoring when the process yields a linear profile. Journal of Quality Technology 32 4 (2000) 418-426
    • (2000) Journal of Quality Technology , vol.32 , Issue.4 , pp. 418-426
    • Kang, L.1    Albin, S.L.2
  • 14
    • 8344221961 scopus 로고    scopus 로고
    • Phase I analysis of linear profiles with calibration applications
    • Mahmoud M.A., and Woodall W.H. Phase I analysis of linear profiles with calibration applications. Technometrics 46 4 (2004) 380-391
    • (2004) Technometrics , vol.46 , Issue.4 , pp. 380-391
    • Mahmoud, M.A.1    Woodall, W.H.2
  • 24
    • 0032562633 scopus 로고    scopus 로고
    • Statistical quality control applied to ion chromatography calibrations
    • Stover F.S., and Brill R.V. Statistical quality control applied to ion chromatography calibrations. Journal of Chromatography A 804 1-2 (1998) 37-43
    • (1998) Journal of Chromatography A , vol.804 , Issue.1-2 , pp. 37-43
    • Stover, F.S.1    Brill, R.V.2
  • 27
    • 27744432092 scopus 로고    scopus 로고
    • Using profile monitoring techniques for a data-rich environment with huge sample size
    • Wang K., and Tsung F. Using profile monitoring techniques for a data-rich environment with huge sample size. Quality and Reliability Engineering International 21 7 (2005) 677-688
    • (2005) Quality and Reliability Engineering International , vol.21 , Issue.7 , pp. 677-688
    • Wang, K.1    Tsung, F.2
  • 29
    • 41549166315 scopus 로고    scopus 로고
    • Current research on profile monitoring
    • Woodall W.H. Current research on profile monitoring. Revista Producão 17 3 (2007) 420-425
    • (2007) Revista Producão , vol.17 , Issue.3 , pp. 420-425
    • Woodall, W.H.1
  • 31
    • 36849064218 scopus 로고    scopus 로고
    • Monitoring general linear profiles using multivariate exponentially weighted moving average schemes
    • Zou C., Tsung F., and Wang Z. Monitoring general linear profiles using multivariate exponentially weighted moving average schemes. Technometrics 49 4 (2007) 395-408
    • (2007) Technometrics , vol.49 , Issue.4 , pp. 395-408
    • Zou, C.1    Tsung, F.2    Wang, Z.3
  • 32
    • 33750108055 scopus 로고    scopus 로고
    • Control chart based on change-point model for monitoring linear profiles
    • Zou C., Zhang Y., and Wang Z. Control chart based on change-point model for monitoring linear profiles. IIE Transactions 38 12 (2006) 1093-1103
    • (2006) IIE Transactions , vol.38 , Issue.12 , pp. 1093-1103
    • Zou, C.1    Zhang, Y.2    Wang, Z.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.