Using profile monitoring techniques for a data-rich environment with huge sample size

Quality and Reliability Engineering International

Volumn 21, Issue 7, 2005, Pages 677-688

  Wang, Kaibo ^a   Tsung, Fugee ^a,b  

^a HONG KONG UNIVERSITY OF SCIENCE AND TECHNOLOGY   (Hong Kong)

^b Institute for Operations Research and the Management Sciences (INFORMS)   (Hong Kong)

Author keywords

Profile; Q Q plot; Sample size; Statistical process control

Indexed keywords

MONITORING TECHNIQUES; PROFILE; Q-Q PLOT; SAMPLE SIZE;

DATA ACQUISITION; INDUSTRIAL MANAGEMENT; MONITORING; STATISTICAL PROCESS CONTROL;

SENSORS;

EID: 27744432092     PISSN: 07488017     EISSN: None     Source Type: Journal    
DOI: 10.1002/qre.711     Document Type: Conference Paper

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