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Volumn 82, Issue 8, 2003, Pages 1179-1181

Direct measurements of grain boundary sliding in yttrium-doped alumina bicrystals

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINA; CREEP TESTING; DOPING (ADDITIVES); ENERGY DISPERSIVE SPECTROSCOPY; GRAIN BOUNDARIES; HIGH RESOLUTION ELECTRON MICROSCOPY; HIGH TEMPERATURE EFFECTS; IONS; TRANSMISSION ELECTRON MICROSCOPY; YTTRIUM;

EID: 0037463340     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1555690     Document Type: Article
Times cited : (51)

References (27)
  • 3
    • 0002360471 scopus 로고
    • edited by J. J. Brake, N. L. Reed, and V. Weiss (Syracuse University Press, Syracuse, NY)
    • A. H. Heuer, R. M. Cannon, and N. J. Tighe, in Ultrafine-Grain Ceramics, edited by J. J. Brake, N. L. Reed, and V. Weiss (Syracuse University Press, Syracuse, NY, 1970), p. 339.
    • (1970) Ultrafine-Grain Ceramics , pp. 339
    • Heuer, A.H.1    Cannon, R.M.2    Tighe, N.J.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.