Study of top and bottom contact resistance in one organic field-effect transistor

Chinese Physics B

Volumn 18, Issue 8, 2009, Pages 3530-3534

  Ge, Liu ^a   Ming, Liu ^a   Hong, Wang ^a   Li Wei, Shang ^a   Zhuo Yu, Ji ^a   Xing Hua, Liu ^a   Jiang, Liu ^a  

^a INSTITUTE OF MICROELECTRONICS   (China)

Author keywords

Bottom contact geometry; Hybrid contact geometry; Organic field effect transistor; Top contact geometry

Indexed keywords

BOTTOM CONTACT GEOMETRY; BOTTOM CONTACTS; BOTTOM ELECTRODES; CONTACT DEVICE; CONTACT GEOMETRY; HYBRID CONTACT GEOMETRY; NOVEL STRUCTURES; ORGANIC FIELD-EFFECT TRANSISTOR; ORGANIC FIELD-EFFECT TRANSISTORS; PARALLEL RESISTANCE; TOP CONTACT; TOP CONTACT GEOMETRY; TOP-CONTACT DEVICES;

COMPUTATIONAL GEOMETRY; CONTACT RESISTANCE; ELECTRODES;

FIELD EFFECT TRANSISTORS;

EID: 68949220993     PISSN: 16741056     EISSN: None     Source Type: Journal    
DOI: 10.1088/1674-1056/18/8/065     Document Type: Article

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