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Volumn 102, Issue 5, 2007, Pages

Influence of traps on top and bottom contact field-effect transistors based on modified poly(phenylene-vinylene)

Author keywords

[No Author keywords available]

Indexed keywords

DRAIN CURRENT; ELECTRIC CURRENT MEASUREMENT; NUMERICAL METHODS; POLYPHENYLENE VINYLENE;

EID: 34548617560     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2776252     Document Type: Article
Times cited : (21)

References (31)
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    • (2006) Appl. Phys. Lett. , vol.88 , pp. 262102
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  • 17
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    • 0036-8075 10.1126/science.280.5370.1741
    • H. Sirringhaus, N. Tessler, and R. H. Friend, Science 0036-8075 10.1126/science.280.5370.1741 280, 1741 (1998).
    • (1998) Science , vol.280 , pp. 1741
    • Sirringhaus, H.1    Tessler, N.2    Friend R., H.3
  • 22
    • 34548617238 scopus 로고    scopus 로고
    • ISE-TCAD, Integrated Systems Engineering AG, Zurich, Switzerland, 1995-1999.
    • ISE-TCAD, Integrated Systems Engineering AG, Zurich, Switzerland, 1995-1999.
  • 26
    • 0032202665 scopus 로고    scopus 로고
    • 1057-9257 10.1002/(SICI)1099-0712(199811/12)8:6<285::AID-AMO345>3. 3.CO;2-Q
    • R. Tecklenburg, G. Paasch, and S. Scheinert, Adv. Mater. Opt. Electron. 1057-9257 10.1002/(SICI)1099-0712(199811/12)8:6<285::AID-AMO345>3.3.CO;2-Q 8, 285 (1998).
    • (1998) Adv. Mater. Opt. Electron. , vol.8 , pp. 285
    • Tecklenburg, R.1    Paasch, G.2    Scheinert, S.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.