Reproducible low contact resistance in rubrene single-crystal field-effect transistors with nickel electrodes

Applied Physics Letters

Volumn 88, Issue 11, 2006, Pages

  Hulea, Iulian N ^a   Russo, Saverio ^a   Molinari, Anna ^a   Morpurgo, Alberto F ^a  

^a DELFT UNIVERSITY OF TECHNOLOGY   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRODES; GOLD; NICKEL; SINGLE CRYSTALS;

CONTACT RESISTANCE; RUBRENE;

FIELD EFFECT TRANSISTORS;

EID: 33645136957     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2185632     Document Type: Article

References (15)

1. L. Burgi, T. J. Richards, R. H. Friend, and H. Sirringhaus, J. Appl. Phys. 94, 6129 (2003).
2. Y. L. Shen, A. R. Hosseini, M. H. Wong, and G. G. Malliaras, Chem. Phys. Chem. 5, 16 (2004).
3. P. V. Pesavento, R. J. Chesterfield, C. R. Newman, and C. D. Frisbie, J. Appl. Phys. 96, 7312 (2004).
4. R. A. Street and A. Salleo, Appl. Phys. Lett. 81, 2887 (2002).
5. P. V. Necliudov, M. S. Shur, D. J. Grundlach, and T. N. Jackson, Solid- State Electron. 47, 259 (2003).
6. E. J. Meijer, G. H. Gelinck, E. van Veenendaal, B.-H. Huisman, D. M. de Leeuw, and T. Klapwijk, Appl. Phys. Lett. 82, 4576 (2003).
7. B. H. Hamadani and D. Natelson, Appl. Phys. Lett. 84, 443 (2004).
8. R. W. I. de Boer, M. E. Gerhenson, A. F. Morpurgo, and V. Podzorov, Phys. Status Solidi A 201, 1302 (2004).
9. J. Olivier, B. Servet, M. Vergnolle, M. Mosca, and G. Carry, Synth. Met. 122, 87 (2001).
10. G. B. Blanchet, C. R. Fincher, M. Lefenfeld, and J. A. Rogers, Appl. Phys. Lett. 84, 296 (2004).
11. R. W. I. de Boer, T. M. Klapwijk, and A. F. Morpurgo, Appl. Phys. Lett. 83, 4345 (2003).
12. R. A. Laudise, C. Kloc, P. G. Simpkins, and T. Siegrist, J. Cryst. Growth 187, 449 (1998).
13. A. F. Stassen, R. W. I. de Boer, N. N. Iosad, and A. F. Morpurgo, Appl. Phys. Lett. 85, 3899 (2004).
14. I. M. Chan and C. Hong, Thin Solid Films 450, 304 (2004).
15. x contacts have been claimed to have better performance than identically prepared devices with gold contacts. See J. Lee, D. K. Hwang, J. M. Choi, K. Lee, J. H. Kim, S. Im, J. H. Park, and E. Kim, Appl. Phys. Lett. 87, 023504 (2005). In this work, however, the value of the contact resistance was not measured.