Wavelet-based ADC testing automation using labview

International Review of Electrical Engineering

Volumn 3, Issue 5, 2008, Pages 922-930

  Akujuobi, C M ^a   Awada, E ^a  

^a PRAIRIE VIEW A AND M UNIVERSITY   (United States)

Author keywords

Analog to digital converters; Differential non linearity; Discrete wavelet transform; Effective number of bits; Full scale range; Integral non linearity; Virtual instruments

Indexed keywords

EID: 68949214349     PISSN: 18276660     EISSN: 25332244     Source Type: Journal    
DOI: None     Document Type: Article

References (20)

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