INL and DNL estimation based on noise for ADC test

IEEE Transactions on Instrumentation and Measurement

Volumn 53, Issue 5, 2004, Pages 1391-1395

  Flores, Maria da Glória Cataldi ^a   Negreiros, Marcelo ^a   Carro, Luigi ^a   Susin, Altamiro A ^a  

^a FEDERAL UNIVERSITY OF RIO GRANDE DO SUL   (Brazil)

Author keywords

[No Author keywords available]

Indexed keywords

BUILT-IN SELF TEST; DIFFERENTIAL EQUATIONS; ESTIMATION; INTEGRAL EQUATIONS; MATHEMATICAL MODELS; POLYNOMIALS; SPURIOUS SIGNAL NOISE; TRANSFER FUNCTIONS;

ANALOG TO DIGIATAL (ADC) CHARACTERIZATION; CHEBYCHEV POLYNOMIAL; DIFFERENTIAL NONLINEARITY (DNL) ESTIMATION; LINEARITY ERROR ESTIMATION; NOISE BASED ADC TEST; NOISED BASED INTEGRAL NONLINEARITY (INL);

ANALOG TO DIGITAL CONVERSION;

EID: 4744351651     PISSN: 00189456     EISSN: None     Source Type: Journal    
DOI: 10.1109/TIM.2004.834096     Document Type: Article

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