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Volumn , Issue , 1997, Pages 188-193
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Static testing of ADCs using wavelet transforms
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Author keywords
[No Author keywords available]
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Indexed keywords
ANALOG TO DIGITAL CONVERTERS ERRORS;
STATIC TESTING;
DIGITAL TO ANALOG CONVERSION;
ERROR ANALYSIS;
SIGNAL TO NOISE RATIO;
WAVELET TRANSFORMS;
ANALOG TO DIGITAL CONVERSION;
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EID: 0031363155
PISSN: 10817735
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
Times cited : (7)
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References (8)
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