Dynamic testing of ADCs using wavelet transforms

IEEE International Test Conference (TC)

Volumn , Issue , 1997, Pages 379-388

  Yamaguchi, Takahiro ^a   Soma, Mani ^a  

^a ADVANTEST CORPORATION   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ANALOG TO DIGITAL CONVERSION; MATHEMATICAL MODELS; WAVELET TRANSFORMS;

QUANTIZATION ERRORS;

INTEGRATED CIRCUIT TESTING;

EID: 0031367238     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (18)